2019
DOI: 10.3390/electronics8070767
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Measuring the Power Law Phase Noise of an RF Oscillator with a Novel Indirect Quantitative Scheme

Abstract: In conventional phase noise metrology, the phase noise of an oscillator is measured by instruments equipped with specialized and sophisticated devices. Such hardware-based testing usually requires high-performance and costly apparatuses. In this paper, we carried out a novel phase noise measurement method based on a mathematical model. The relationship between the phase noise of a radio frequency oscillator and its power spectral density (PSD) was established, different components of the power law phase noise … Show more

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Cited by 6 publications
(3 citation statements)
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References 23 publications
(40 reference statements)
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“…It is possible to further implement the MIM as a spatially-resolved readout instrument for memories with great resistivity changes [72]. MIM cannot detect small topographic changes with phases changes, but can directly measure local electronic properties and is more sensitive to operations [73][74][75][76]. The author demonstrates that the MIM can provide spatially resolved information when In 2 Se 3 nano-devices are phase-switched by voltage pulses [72].…”
Section: Electronic Inhomogeneitymentioning
confidence: 98%
“…It is possible to further implement the MIM as a spatially-resolved readout instrument for memories with great resistivity changes [72]. MIM cannot detect small topographic changes with phases changes, but can directly measure local electronic properties and is more sensitive to operations [73][74][75][76]. The author demonstrates that the MIM can provide spatially resolved information when In 2 Se 3 nano-devices are phase-switched by voltage pulses [72].…”
Section: Electronic Inhomogeneitymentioning
confidence: 98%
“…The PSD of the PN is typically modelled via a power law noise [ 44 , 45 ]: where f is the frequency, is a constant parameter of the model and are the summation parameters, defining the PN type, e.g., corresponds to a white-noise model (with 0 for additive white noise sources external to the oscillator and 2 for additive white noise sources internal to the oscillator), corresponds to a flicker PN (i.e., 1 for flicker phase noise and 3 for flicker frequency noise), and corresponds to a random-walk PN.…”
Section: Transmitter Hardware Impairments or ‘Rf Features’ Overviewmentioning
confidence: 99%
“…In many types of time series of natural phenomena, noise can be described by a power-law noise process [29]. This kind of noise has been identified in, e.g., music [30], economics [31], geophysical data [32], electronic devices [33], astronomy [34], and GNSS positions [35]. There are several ways to determine this kind of noise, most of which are based on spectral analyses or maximum likelihood estimation [32,36].…”
Section: Introductionmentioning
confidence: 99%