2000
DOI: 10.1103/physrevb.62.1178
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Measurement of resistance and spin-memory loss (spin relaxation) at interfaces using sputtered current perpendicular-to-plane exchange-biased spin valves

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Cited by 98 publications
(145 citation statements)
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“…Two common methods to quantify the strength of the SHE are to employ ferromagnet/normal metal (FM/NM) bilayers and either (1) detect the spin transfer torque that the SHE-induced spin current from the NM layer exerts on the magnetization of the adjacent FM layer [19,20], or (2) use spin pumping to inject a spin current from the FM to the NM and detect the electric current in the NM layer that is induced by the inverse SHE (ISHE) [21][22][23]. In the former case due to spin backflow (SBF) at the FM/NM interface [24,25] and/or enhanced spin scattering at the interface (spin memory loss or SML) [26], only a portion NM|FM [19,[27][28][29][30][31], beta-Ta [19] and beta-W [4].…”
mentioning
confidence: 99%
“…Two common methods to quantify the strength of the SHE are to employ ferromagnet/normal metal (FM/NM) bilayers and either (1) detect the spin transfer torque that the SHE-induced spin current from the NM layer exerts on the magnetization of the adjacent FM layer [19,20], or (2) use spin pumping to inject a spin current from the FM to the NM and detect the electric current in the NM layer that is induced by the inverse SHE (ISHE) [21][22][23]. In the former case due to spin backflow (SBF) at the FM/NM interface [24,25] and/or enhanced spin scattering at the interface (spin memory loss or SML) [26], only a portion NM|FM [19,[27][28][29][30][31], beta-Ta [19] and beta-W [4].…”
mentioning
confidence: 99%
“…Theory. From Valet-Fert (VF) theory of CPP-MR [5,[8][9][10], as the thickness t IrMn of the IrMn insert grows, AΔR should decrease as in Eq. (1), where the IrMn/Cu interface is assumed to have finite thickness, t I ~ 0.6-0.8 nm [11].…”
mentioning
confidence: 99%
“…[1] gave a general technique for measuring the spin-flipping probability at non-magnetic (N1/N2) interfaces, P N1/N2 , and its related parameter δ N1/N2 given by P N1/N2 = 1 -exp (-δ N1/N2 ). That technique has been used to obtain values of δ N1/N2 for a number of sputtered N1/N2 pairs [1,2]. It involves inserting an [N1/N2] n multilayer (n = number of repeats) into the middle of the central Cu layer of a Permalloy (Py = Ni 1-x Fe x with x ~ 0.2) based exchangebiased spin-valve (EBSV).…”
mentioning
confidence: 99%