2014
DOI: 10.1109/lpt.2013.2291841
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Mapping Temperature in OLED Displays Using CCD Thermoreflectance

Abstract: Effective thermal management is essential to engineering organic devices, since heating accelerates their degradation. However, as pixels in organic light-emitting diode (OLED) displays continue to shrink, an important tool for thermal management, infrared thermography, approaches the limits of its spatial resolution. To address this problem, we adapt highresolution thermoreflectance imaging, which measures minute changes in reflectivity of visible light, to map temperature in a commercial OLED display. We ide… Show more

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Cited by 4 publications
(4 citation statements)
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“…By generating thermal images, it can display the temperature curve of organic light-emitting diodes (OLEDs) over time, and the thermal crosstalk of adjacent pixels can be observed. The experimental setup is illustrated in Figure 13, utilizing an inorganic LED as the light source for the optical microscope, reflected from the OLED display, and imaged by the CCD camera [104]. Kendig et al [105] used thermal reflection imaging to determine the two-dimensional temperature pattern of encapsulated UV and blue LEDs.…”
Section: Thermal Reflection Imaging Methodsmentioning
confidence: 99%
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“…By generating thermal images, it can display the temperature curve of organic light-emitting diodes (OLEDs) over time, and the thermal crosstalk of adjacent pixels can be observed. The experimental setup is illustrated in Figure 13, utilizing an inorganic LED as the light source for the optical microscope, reflected from the OLED display, and imaged by the CCD camera [104]. Kendig et al [105] used thermal reflection imaging to determine the two-dimensional temperature pattern of encapsulated UV and blue LEDs.…”
Section: Thermal Reflection Imaging Methodsmentioning
confidence: 99%
“…Katz et al [104] quantified changes in reflectivity normalization concerning commercial OLED displays, albeit with a limitation in resolution. While a time resolution of approximately milliseconds can be achieved in the measurement of junction temperature, it is essential to acknowledge the low resolution inherent in this approach.…”
Section: Thermal Reflection Imaging Methodsmentioning
confidence: 99%
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