2017
DOI: 10.1063/1.4985649
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Making the Dzyaloshinskii-Moriya interaction visible

Abstract: Brillouin light spectroscopy is a powerful and robust technique for measuring the interfacial Dzyaloshinskii-Moriya interaction in thin films with broken inversion symmetry. Here we show that the magnon visibility, i.e. the intensity of the inelastically scattered light, strongly depends on the thickness of the dielectric seed material - SiO$_2$. By using both, analytical thin-film optics and numerical calculations, we reproduce the experimental data. We therefore provide a guideline for the maximization of th… Show more

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Cited by 20 publications
(15 citation statements)
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“…A series of X(5)/Co 20 Fe 60 B 20 (1)/MgO(2)/Ta(2) and X(5)/ Co(1)/MgO(2)/Ta(2) (X = Ta, W, Ir, Pt) thin films were deposited by magnetron sputtering at room temperature on silicon substrates, where the numbers in parentheses denote the nominal layer thicknesses in nanometers. We used thermally oxidized Si substrates with around 100 nm SiO2 on surface, because the light signal is optimized for all incident angle used in BLS [39]. Co 20 Fe 60 B 20 (1)/MgO(2)/ Ta(2) and Co(1)/MgO(2)/Ta(2) multilayers were also sputtered onto Au(5) underlayer prepared with e-beam evaporation.…”
mentioning
confidence: 99%
“…A series of X(5)/Co 20 Fe 60 B 20 (1)/MgO(2)/Ta(2) and X(5)/ Co(1)/MgO(2)/Ta(2) (X = Ta, W, Ir, Pt) thin films were deposited by magnetron sputtering at room temperature on silicon substrates, where the numbers in parentheses denote the nominal layer thicknesses in nanometers. We used thermally oxidized Si substrates with around 100 nm SiO2 on surface, because the light signal is optimized for all incident angle used in BLS [39]. Co 20 Fe 60 B 20 (1)/MgO(2)/ Ta(2) and Co(1)/MgO(2)/Ta(2) multilayers were also sputtered onto Au(5) underlayer prepared with e-beam evaporation.…”
mentioning
confidence: 99%
“…The Ir22Mn78(t)/Co20Fe60B20(2)/MgO(2)/Ta(2) multilayer thin films were deposited by magnetron sputtering at room temperature on thermally oxidized silicon substrates, where the subscript represents the percentage of each element in the alloyed layer and the numbers in parentheses denote the nominal layer thicknesses in nanometers. We used thermally oxidized Si substrates with around 100 nm SiO2 on surface, because the light signal is optimized for all incident angle used in BLS [36]. Different from Ref.…”
mentioning
confidence: 99%
“…The mechanism of DMI measurement using BLS setup is depicted in Figure . Hrabec et al carried out some measurements on samples with different SiO 2 substrate thickness, which can be conducive to choosing appropriate substrate to enhance the BLS signal. With the propagation of spin wave, all‐electrical methods are also a possible way to measure DMI .…”
Section: Modulation Of Hm/fm Interface For Strong Dmimentioning
confidence: 99%