Abstract:This paper presents two circuit models of the electromagnetic (EM) clamp defined in Standard IEC 61000-4-6 for conducted-immunity (CI) testing. First, a lumped-parameter circuit model is extracted from measurements of scattering parameters. This model is merely behavioral since it provides a valid representation of the EM clamp at external ports up to 1 GHz, whereas physical interpretation of the involved sources/impedances is possible under 10 MHz only. To extend physical insight at higher frequencies, a dist… Show more
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