Low energy cluster impact simulated by molecular dynamics; angular distribution of sputtering yield and impact under various impact angles

Barghorn, Knut; Hilf, Eberhard R.

doi:10.1016/0168-583x(94)96104-2

Nuclear Instruments and Methods in Physics Research Section B:

1994

DOI: 10.1016/0168-583x(94)96104-2

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Low energy cluster impact simulated by molecular dynamics; angular distribution of sputtering yield and impact under various impact angles

Knut Barghorn

Eberhard R. Hilf

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Cited by 8 publications

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Low energy cluster impact simulated by molecular dynamics; angular distribution of sputtering yield and impact under various impact angles

Cited by 8 publications

References 8 publications

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Sample and plume luminescence in fast heavy ion induced desorption

Crater formation by ion bombardment as a function of incident angle

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