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Kovalev, V. I.; Кузнецов, П. И.; Житов, В. А.; Zakharov, L. Yu.; Rukovishnikov, A.I.; Хомич, А. В.; Yakushcheva, G. G.; Гапоненко, С. В.

doi:10.1023/a:1016109806991

Cited by 9 publications

(6 citation statements)

References 8 publications

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“…2, 3, 4, 7 upper panels). With increasing number of periods absolute values of reflection coefficient at central reflection peak as well as at multiple secondary reflection bands increase in a good agreement with the theoretical simulations using the material parameters taken from ellipsometry measurements performed for original ZnSe and ZnS films at a GaAs substrates [14,15]. Samples with different number of periods showed similar behavior at optical excitation: a pronounced modification of reflection spectra within the wide spectral range limited by an intrinsic ZnSe absorption onset at the short-wave side and the detection cut-off wavelength (750 nm) at the long-wave side.…”

Section: Samples Characterizationsupporting

confidence: 79%

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Nonlinear multilayer heterostructure based on ZnSe/ZnS

Ermolenko¹,

Станкевич²,

Буганов³

et al. 2005

SPIE Proceedings

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We investigated ultrafast nonlinear optical properties of periodiс structures based on ZnSe/ZnS using interband and two-photon excitation of ZnSe sublatice by nano-, pico-, and femtosecond laser pulses. A considerable shift of reflection spectrum and large relative reflection changes were observed in a wide spectral range corresponding to the transparency region of ZnSe far from the intrinsic absorption onset. The nonlinear refraction is supposed to be controlled by population induced absorption changes in ZnSe and the relaxation time is controlled by a transition from non-equilibrium to quasi-equilibrium distribution of electrons and holes.

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Section: Samples Characterizationsupporting

confidence: 79%

“…In Fig. 4 (lower panel) presented is a set of differential reflection spectra of a GaAsZnSe 105nm [ZnS 55nm ZnSe 53nm ] 15 15-period sample recorded for different probe versus pump delay. For clarity, nonlinear differential spectra are superimposed with the linear reflection spectrum (upper panel).…”

Section: Picosecond Time Rangementioning

confidence: 99%

Nonlinear multilayer heterostructure based on ZnSe/ZnS

Ermolenko¹,

Станкевич²,

Буганов³

et al. 2005

SPIE Proceedings

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“…The obtained set of experimental data confirms that the synthesized material is silicon oxynitride. The thicknesses of the obtained coatings were determined via ellipsometry as well using theoretical models [ 43 ]. The obtained film thicknesses were used to determine the deposition rate of the coating for each separate deposition regime.…”

Section: Resultsmentioning

confidence: 99%

Silicon Oxynitride Thin Film Coating to Lossy Mode Resonance Fiber-Optic Refractometer

Sudas

Zakharov

Jitov

et al. 2022

Sensors

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A fiber-optic refractometer for various liquids with refractive indices in the range from 1.33 to 1.43 has been manufactured and tested. The sensor is based on a thin silicon oxynitride (Si3N4-xOx) film coated thinned optic fiber section (taper) obtained in a multimode all-silica optical fiber by chemical etching of the reflective cladding. The film was deposited on the cylindrical surface of the thinned fiber by the surface plasma chemical vapor deposition method (SPCVD). Lossy mode resonance (LMR) was observed in the transmission spectrum of the coated taper at a wavelength dependent on the refractive index of the liquid in which the taper was immersed. We tested the obtained sensors in distilled water, isopropyl alcohol, dimethylformamide, and their aqueous solutions. It was found that with the help of the SPCVD, one can obtain a set of sensors in a single deposition run with the dispersion of sensitivity and spectral position of LMR no more than 5%. Maximum sensitivity of the manufactured sensors to surrounding media refractive index (SMRI) variation exceeds 1090 nm/RIU, which is the highest value recorded to date for a sensor with a non-oxide coating.

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“…Optical constants of single ZnS and ZnSe layers and heterostructures were evaluated by means of spectral ellipsometry with binary modulation of polarization state. Growth and ellipsometry details have been described elsewhere [5]. Parameters of periodic heterostructures were chosen to get optical reflection maximum in the blue range.…”

Section: Resultsmentioning

confidence: 99%

OPTICAL PROPERTIES OF MULTILAYER HETEROSTRUCTURES BASED ON ZnSe/ZnS

Кузнецов¹,

Yakushcheva²,

Kovalev³

et al. 2003

Physics, Chemistry and Application of Nanostructures

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Growth o f m ultilayer p eriodic Z nS/ZnSe h eterostructures b y m etallorganic c hemical v apor deposition, their optical properties examined by ellipsometry and traditional spectroscopy are described. The results obtained evidence that the structures proposed are promising as efficient Bragg reflectors for blue semiconductor lasers. Reflection coefficient higher than 90% in the blue-green spectral range have been obtained.

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Untitled

Cited by 9 publications

References 8 publications

Nonlinear multilayer heterostructure based on ZnSe/ZnS

Nonlinear multilayer heterostructure based on ZnSe/ZnS

Silicon Oxynitride Thin Film Coating to Lossy Mode Resonance Fiber-Optic Refractometer

OPTICAL PROPERTIES OF MULTILAYER HETEROSTRUCTURES BASED ON ZnSe/ZnS

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