2018
DOI: 10.1016/j.tsf.2018.08.044
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Lithographic fabrication of point contact with Al2O3 rear-surface-passivated and ultra-thin Cu(In,Ga)Se2 solar cells

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Cited by 20 publications
(28 citation statements)
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“…For the thickest CIGS absorber layer, i.e., 1.89 µm, the difference between passivated and reference devices are hardly noticeable for Voc and Jsc, but there is still an improvement [16]. On the other hand, for the thinnest CIGS absorber layer, i.e., 240 nm, there are clear improvements in both Voc and Jsc, as expected [18].…”
Section: Solar Simulator Resultssupporting
confidence: 60%
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“…For the thickest CIGS absorber layer, i.e., 1.89 µm, the difference between passivated and reference devices are hardly noticeable for Voc and Jsc, but there is still an improvement [16]. On the other hand, for the thinnest CIGS absorber layer, i.e., 240 nm, there are clear improvements in both Voc and Jsc, as expected [18].…”
Section: Solar Simulator Resultssupporting
confidence: 60%
“…To conclude, remarkable progress has been made in creating dielectric-based rear contact passivation strategies for CIGS solar cells. A cell efficiency of 18.1% has been achieved with the conventional, i.e., 1.89 µm thick absorber layer, CIGS solar cell which has a 5 nm thick atomic-layer-deposited Al 2 O 3 passivation layer with contact openings realized with photo-lithography [16]. For ultra-thin, i.e., 0.4 µm thick absorber layer, CIGS solar cells, the highest efficiency value, 13.5%, was realized in [14].…”
Section: Discussionmentioning
confidence: 99%
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“…To mitigate the effect of reduced voltage, efficient surface passivation has to be ensured. Thin passivation layers, such as Al2O3 have been applied to the rear CIGS/Mo interface [11][12][13][14]. To compensate for reduced photocurrent, an additional treatment to increase light absorption in the thin absorber needs to be carried out.…”
Section: Introductionmentioning
confidence: 99%