1996
DOI: 10.1016/0022-3093(96)00076-2
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Laser induced nucleation and growth of polycrystalline silicon

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Cited by 9 publications
(2 citation statements)
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“…This shift cannot be due to size effects, since an increase of the crystallization intensity, which leads to larger grains, leaves the peak position ͑and its width͒ unaffected. Moreover, atomic force microscopy showed that lasercrystallized seeds in a-Si films grown by plasma-enhanced chemical vapor deposition ͑CVD͒ contained grains of about 0.5 m. 9 The shift is attributed to a biaxial tensile stress X s in the plane of the film. 11 This stress arises from ͑i͒ the higher density of the laser-crystallized material with respect to the a-Si, ͑ii͒ the difference in thermal contraction between the laser-crystallized material and the substrate.…”
mentioning
confidence: 99%
“…This shift cannot be due to size effects, since an increase of the crystallization intensity, which leads to larger grains, leaves the peak position ͑and its width͒ unaffected. Moreover, atomic force microscopy showed that lasercrystallized seeds in a-Si films grown by plasma-enhanced chemical vapor deposition ͑CVD͒ contained grains of about 0.5 m. 9 The shift is attributed to a biaxial tensile stress X s in the plane of the film. 11 This stress arises from ͑i͒ the higher density of the laser-crystallized material with respect to the a-Si, ͑ii͒ the difference in thermal contraction between the laser-crystallized material and the substrate.…”
mentioning
confidence: 99%
“…Hence the generated diffracted waves along the surface interfere with the incident waves [143,145], modifying the surface morphology when the interference is sufficiently strong. as-grown and laser treated 400 nm thick a-Si thin films treated with the energy densities of 294 mJ/cm 2 , 380 mJ/cm 2 ,439 mJ/cm 2 and 507 mJ/cm 2 .…”
Section: Crystallization Of A-si and Formation Of Nanodome Structurementioning
confidence: 99%