2016
DOI: 10.1103/physrevapplied.5.044006
|View full text |Cite
|
Sign up to set email alerts
|

Large Voltage-Induced Changes in the Perpendicular Magnetic Anisotropy of an MgO-Based Tunnel Junction with an Ultrathin Fe Layer

Abstract: We study the voltage control of perpendicular magnetic anisotropy in an ultrathin Fe layer sandwiched between the Cr buffer and MgO tunneling barrier layers. A high-interface magnetic anisotropy energy of 2.1 mJ=m 2 is achieved in the Cr/ultrathin Fe=MgO structure. A large voltage-induced perpendicular magnetic anisotropy change is observed under the negative-bias voltage applications for the case of the Fe layer thinner than 0.6 nm. The amplitude of the voltage-induced anisotropy energy change exhibits a stro… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

13
126
3

Year Published

2017
2017
2024
2024

Publication Types

Select...
5
1

Relationship

1
5

Authors

Journals

citations
Cited by 154 publications
(145 citation statements)
references
References 59 publications
13
126
3
Order By: Relevance
“…The following discussion assumes an effective magnetic dead layer (t d ) with a thickness of 0.09 nm, which can be estimated from the nominal Fe thickness dependence of the magnetic moment (see Supplementary Information S4). The existence of the t d is mainly attributed to intermixing at the Cr/Fe interface; 36,37 we observed no clear changes in the t d with changes in the inserted Ir thickness. Figure 3a shows the t Ir dependence of the saturation magnetization (M S ) for a fixed t Fe = 1.0 nm.…”
Section: Resultsmentioning
confidence: 49%
See 4 more Smart Citations
“…The following discussion assumes an effective magnetic dead layer (t d ) with a thickness of 0.09 nm, which can be estimated from the nominal Fe thickness dependence of the magnetic moment (see Supplementary Information S4). The existence of the t d is mainly attributed to intermixing at the Cr/Fe interface; 36,37 we observed no clear changes in the t d with changes in the inserted Ir thickness. Figure 3a shows the t Ir dependence of the saturation magnetization (M S ) for a fixed t Fe = 1.0 nm.…”
Section: Resultsmentioning
confidence: 49%
“…This value is~1.8 times greater than that observed in the pure/MgO interface (2.0 mJ m − 2 ). 35,36 Further doping of Ir leads to a reduction in this value; however, even at t Ir = 0.15 nm, the K i,0 value is still greater than that for the sample without Ir doping. It should be emphasized that no PMA was observed at the Cr/Ir-doped Fe interface (see Supplementary Information S6), similar to the Cr/Fe structure.…”
Section: Resultsmentioning
confidence: 87%
See 3 more Smart Citations