2020
DOI: 10.1016/j.cherd.2020.07.007
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Large temperature range model for the atmospheric pressure chemical vapor deposition of silicon dioxide films on thermosensitive substrates

Abstract: Large temperature range model for theatmospheric pressure chemical vapor deposition ofsilicon dioxide films on thermosensitive substrates. (2020) Chemical Engineering Research and Design, 161. 146-158.

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Cited by 10 publications
(13 citation statements)
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References 37 publications
(43 reference statements)
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“…Between 0.1 and 0.3 m, the temperature profile presents a W shape. This emerges as the result of a double vortex trajectory of the gas in the inlet region, which has been explained in more detail elsewhere [27]. This W shape is also observed in the mass fraction profiles.…”
Section: Simulation Results and Discussionsupporting
confidence: 63%
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“…Between 0.1 and 0.3 m, the temperature profile presents a W shape. This emerges as the result of a double vortex trajectory of the gas in the inlet region, which has been explained in more detail elsewhere [27]. This W shape is also observed in the mass fraction profiles.…”
Section: Simulation Results and Discussionsupporting
confidence: 63%
“…rectangles and used as substrates, supported in a vertical array by two home-made, tubular, stainless steel substrate-holders, as illustrated in the photograph in Fig. 1 (b), covering the 5.7-50.0 cm region of the reactor [27]. A total of 18 Si coupons were utilized for each run.…”
Section: On Purpose Configuration Of the Cvd Reactor And Deposition C...mentioning
confidence: 99%
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“…The experimental setup has already been presented in previous work. 33 The exit of the reactor setup was slightly modified as illustrated in Figure S1 of Supporting Information, to enable the sampling for the three gas phase analyses. Silicon <100> wafers (Neyco, 24x32 mm 2 ) are used as substrates.…”
Section: Silicon Oxynitride Depositionmentioning
confidence: 99%