2020
DOI: 10.1002/pip.3277
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Large open‐circuit voltage boosting of pure sulfide chalcopyrite Cu(In,Ga)S2 prepared using Cu‐deficient metal precursors

Abstract: We performed a comparative study to find out the reasons why it is necessary to prepare the pure sulfide chalcopyrite, Cu(InGa)S2 (CIGS) under a Cu‐deficient condition to improve solar cell performance. It has been shown that CIGS that was grown under Cu‐deficient condition exhibits large open‐circuit voltage (VOC) boosting compared with that the one grown under Cu‐excess condition. Thus, CIGS were prepared from Cu‐excess and Cu‐deficient metal precursor (MP) and characterized concerning the origins of the dif… Show more

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Cited by 18 publications
(30 citation statements)
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“…In the previous study by Barreau et al on CIGSu films prepared by coevaporation [3], similar trends were observed, with a decrease of the deep level peak when the deposition temperature was increased. In our case we observe similar luminescence spectra and can attribute the high energy peak to band to band, or shallow level to band transitions [20] in the top layer with a low GGI, and the lower energy peak to similar deep levels.…”
Section: Sulfurized Layers On Siliconsupporting
confidence: 77%
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“…In the previous study by Barreau et al on CIGSu films prepared by coevaporation [3], similar trends were observed, with a decrease of the deep level peak when the deposition temperature was increased. In our case we observe similar luminescence spectra and can attribute the high energy peak to band to band, or shallow level to band transitions [20] in the top layer with a low GGI, and the lower energy peak to similar deep levels.…”
Section: Sulfurized Layers On Siliconsupporting
confidence: 77%
“…It is characterized by a sharp peak centered at 1.52 eV and a smaller peak at a lower energy of about 1.3 eV. Several studies address the analysis of luminescence spectra of copper indium gallium sulfide and copper indium sulfide as recalled in a recent paper from Kim et al [20]. This paper deals with layers formed under copper rich and copper poor conditions.…”
Section: Sulfurized Layers On Siliconmentioning
confidence: 99%
“…6,[13][14][15][16] Moreover, rather low QFLS and short charge-carrier lifetimes ($hundreds of ps) are typically observed for Cu(In,Ga)S 2 . 7,14 This implies significant non-radiative recombination in Cu(In,Ga) S 2 . The origin of non-radiative recombination lies in both bulk and interface (frontand back-contact) defects.…”
Section: Context and Scalementioning
confidence: 99%
“…They observed higher Voc for Cu-poor over Curich Cu(In,Ga)S 2 , which was attributed to lower bulk defects and reduced interface recombination in the former. 7 All approaches to increase efficiency relied on toxic H 2 S, Cd-and/or KCN-based process. Moreover, the physical insights are still missing.…”
Section: Context and Scalementioning
confidence: 99%
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