Strong room-temperature grain coarsening in gold films on polyimide induced by cyclic uniaxial mechanical strain is demonstrated. Detailed electron backscatter diffraction analysis revealed that, in contrast to the predictions of shear-coupled grain boundary migration model, the grain coarsening is isotropic and coarsened grains do not exhibit any specific crystallographic orientations or misorientations to the neighboring grains. It is shown that a thermodynamic model where the driving force appears due to the difference in yield stresses between the grains with different sizes provides an adequate explanation of the experimental data.Room temperature grain coarsening induced by mechanical loading has been shown to occur in Cu [1-3], Pt [4], Ni [5], Al [6][7][8], and Au [9] under different loading conditions such as nanoindentation [1,6], monotonic tensile loading [7,8], fatigue loading [2][3][4]9] as well as beam bending [5]. Despite the large number of experimental evidences, very little is known about the driving forces behind the athermal grain coarsening. In systematic investigations of nanocrystalline Al thin films [7,8] the authors were not able to explain the observed grain coarsening with "traditional driving forces"[7] and it was suggested that shear coupled grain boundary migration (SCGBM) is responsible for the grain growth. However, the SCGBM concept was developed to explain the grain boundary (GB) migration at elevated temperatures in bicrystals with clearly defined GB planes, GB types and misorientations [10][11][12]. In polycrystals, the grain boundaries are often of mixed type and have no coincidence site lattices. Although the SCGBM was generally observed in polycrystals [13,14], the tangential displacement of the grains with respect to the boundary must be restricted due to the constraint caused by the neighboring grains [15]. Thus, it is currently unclear to which extent the SCGBM concept can be applied to explain the grain coarsening effect in real polycrystals. It is necessary to note, that grain coarsening can also occur without GB migration as demonstrated for nanocrystalline Au films [9] where a nanotwin-assisted GB elimination mechanism was proposed.In the present work, a detailed electron backscatter diffraction (EBSD) characterization is utilized to analyze possible driving forces governing severe room temperature grain coarsening in cyclically loaded ultra-fine grained (UFG) gold films.The gold films were deposited on 50 µm polyimide Upilex substrates by electron beam evaporation in a Balzers BAK 550 evaporation machine with the vacuum of 2.1x10 -7 mbar and using a deposition rate of