1988
DOI: 10.1088/0022-3727/21/1/017
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Kilovolt electron energy loss distribution in Si

Abstract: Using the electron-beam-induced barrier currents and the Monte Carlo simulation methods it was possible to determine the depth-dose function as well as the distribution function of the generation source for electron-hole pairs perpendicular to the injection direction. The depth-dose function was compared with results obtained by Everhart and Hoff. By fitting the simulated barrier current profile to the measured one the authors could estimate the relatively small width of the space charge region of the p-n junc… Show more

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Cited by 41 publications
(25 citation statements)
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“…Figure 22 shows the depth-dose distributions at the central axis of Si for an electron beam with energies of 15, 30, 40, and 50 keV [53,54]. The cut-off energy of the electrons and positrons was set to 1 keV.…”
Section: Transmission and Absorption Of Electronsmentioning
confidence: 99%
“…Figure 22 shows the depth-dose distributions at the central axis of Si for an electron beam with energies of 15, 30, 40, and 50 keV [53,54]. The cut-off energy of the electrons and positrons was set to 1 keV.…”
Section: Transmission and Absorption Of Electronsmentioning
confidence: 99%
“…For the LBIC method, we used the approximation of a generation function proportional to the laser beam intensity [7], i.e., g(x, y, z) = , where σ is the beam width, and M is the photon absorption coefficient, i.e., the quantity determining the penetra tion depth. In the case of the EBIC method, for the generation function determination of the Werner model [8] was used. In contrast to the frequently used Donolato model [9], it takes into account the effect of …”
Section: Model For Contrast Calculationmentioning
confidence: 99%
“…Experimental data of the HARP collaboration [3] covers angles from 20° to 123°. This data could be also successfully fitted by the two-source model with χ 2 /n ~ 1 for any HARP momentum (3,5,8,12 GeV/c). If other measurements at large angles are included into fitting procedure, quality of the fit becomes slightly worse (χ 2 /n ~ 2), but still is acceptable.…”
Section: Inclusive and Exclusive Modeling And Event Generatorsmentioning
confidence: 81%