“…A. A. Dahkel [13] reported that by decreasing the concentration of point defects, and hence increasing NiO stoichiometry, a change from (111) to ( 200) is promoted, which in our case should involve higher defect density for the sample Ni:Sn-(9:1). Moreover, the presence of SnO 2 or Sn in the precursors also promotes a shift to higher diffraction angles, as compared with the reference NiO, (Fig.…”