2012
DOI: 10.1016/j.jnoncrysol.2011.09.028
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Investigations on Sn-doped Ni oxide thin films and their use as optical sensor devices

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Cited by 15 publications
(2 citation statements)
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References 35 publications
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“…In addition, at NIR region for k > 2500 nm, the T(k) curves show a clear damping due to the absorption by a high density of free electrons according to classical Drude theory. The optical bandgap E g is expressed in the wellknown formula as [23,24]:…”
Section: Optoelectronic Propertiesmentioning
confidence: 99%
“…In addition, at NIR region for k > 2500 nm, the T(k) curves show a clear damping due to the absorption by a high density of free electrons according to classical Drude theory. The optical bandgap E g is expressed in the wellknown formula as [23,24]:…”
Section: Optoelectronic Propertiesmentioning
confidence: 99%
“…A. A. Dahkel [13] reported that by decreasing the concentration of point defects, and hence increasing NiO stoichiometry, a change from (111) to ( 200) is promoted, which in our case should involve higher defect density for the sample Ni:Sn-(9:1). Moreover, the presence of SnO 2 or Sn in the precursors also promotes a shift to higher diffraction angles, as compared with the reference NiO, (Fig.…”
Section: Structural and Compositional Analysismentioning
confidence: 61%