“…Dose at the surface is primarily due to electron contamination from the flattening filter, beam modifiers and air. The magnitude of the surface dose depends on the field size, angle of beam incidence, air gap and the use of beam modifiers (Biggs and Ling 1979, Gerbi et al 1987, Lamb and Blake 1998, Lopez Medina et al 2005, Petti et al 1983a, 1983b, Yang et al 2004, Zhu and Palta 1998.…”