Interpreting fitting parameters of temperature dependence of dark currents in some CCDs

Abstract

Abstract-The experimental r-esuilts concerning the temperature dependence of the dark currents in some charge-coupled devices (CCDs) were analyzed It was found that the utsed theoretical model allows: (J) the evalutation of the lowest lim?7it Of ex-perimental errors (involving the svstematic ones), (ii) the stutdy of Meyer-Neldel relations, poinlting ouit the high correlation of diffusion dar-k cuirrents with the energy gap Eg. unlike the corresponding weak correlation of depletion dark currents. (iii) raither accuircate assignments of the obtained vailutes of deep-level traps energies to some specific im?puri-ities.