2006
DOI: 10.1103/physrevb.73.094112
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Abstract: Coherent x-ray diffraction ͑CXD͒ is a technique which utilizes the favorable coherence properties of an x-ray beam to collect three-dimensional ͑3D͒ diffraction data from which the 3D shape of a sample can be determined. The shape of the sample is found by reconstructing the phase of the diffracted wave in the far field using iterative techniques and recognizing the relationship between this complex amplitude and the sample's electron density. We describe the experimental procedure for measuring CXD near a hi…

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