2007
DOI: 10.1103/physrevb.75.205411
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Interfacial role in room-temperature diffusion of Au into Si substrates

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Cited by 49 publications
(56 citation statements)
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“…X-ray reflectivity ͑XRR͒ measurements of Ag nanolayers on differently pretreated Si͑001͒ substrates were carried out using a versatile x-ray diffractometer ͑VXRD͒ ͑D8 Discover, Bruker AXS͒ setup. 37 VXRD consists of a diffractometer with Cu source ͑sealed tube͒ followed by a Göbel mirror to select and enhance Cu K␣ radiation ͑ = 1.54 Å͒. The diffractometer has a two-circle goniometer ͓ −2͔ with quarter-circle Eulerian cradle as sample stage.…”
Section: Methodsmentioning
confidence: 99%
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“…X-ray reflectivity ͑XRR͒ measurements of Ag nanolayers on differently pretreated Si͑001͒ substrates were carried out using a versatile x-ray diffractometer ͑VXRD͒ ͑D8 Discover, Bruker AXS͒ setup. 37 VXRD consists of a diffractometer with Cu source ͑sealed tube͒ followed by a Göbel mirror to select and enhance Cu K␣ radiation ͑ = 1.54 Å͒. The diffractometer has a two-circle goniometer ͓ −2͔ with quarter-circle Eulerian cradle as sample stage.…”
Section: Methodsmentioning
confidence: 99%
“…XRR technique 38,39 essentially provides an electron-density profile ͑EDP͒, i.e., in-plane ͑x − y͒ average electron density ͑͒ as a function of depth ͑z͒ in high resolution. 32,37 To see the evolution of EDP, XRR data for one set of samples were collected as a function of time after keeping that set at ambient conditions, while for other set of samples, XRR data have been collected just before and after the samples were in ultrahigh vacuum ͑UHV͒ conditions. X-ray diffraction ͑XRD͒ data around Ag͑111͒ and Ag͑002͒ peaks were collected as a function of time for the same set of samples that kept at ambient conditions for monitoring the evolution of crystallinity and/or epitaxy.…”
Section: Methodsmentioning
confidence: 99%
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