DOI: 10.1103/physrevb.73.075325
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Abstract: The interfacial oxygen diffusion during film growth often results in the appearance of a thin SiO x layer in SrTiO 3 / Si films and related heterojunctions. High-resolution TEM investigations on the La 0.9 Sr 0.1 MnO 3 / SrTiO 3 /Si͑LSMO/ STO/ Si͒ heterojunctions suggested that the thickness and microstructure of the SiO x interfacial layer change visibly from one sample to another grown under slightly different conditions. Electron diffraction observations demonstrated the epitaxial relationships in the LSMO/…

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