Insights into dynamic sliding contacts from conductive atomic force microscopy

Chan, Nicholas; Vazirisereshk, Mohammad R.; Martini, Ashlie; Egberts, Philip

doi:10.1039/d0na00414f

Cited by 4 publications

(3 citation statements)

References 55 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…[40]. In C-AFM, a sharp, metal-coated conductive probe is placed in contact with the sample, a bias voltage is then applied between the probe (movable electrode) and the counter electrode (in contact with the sample), and the resulting current is measured [41,42]. The standard C-AFM operation mode is contact mode, where the tip and the sample are in permanent physical contact.…”

Section: Introduction To C-afmmentioning

confidence: 99%

Nanoscale electrical characterization of graphene-based materials by atomic force microscopy

Silva

Huang

Viswanath

et al. 2022

Journal of Materials Research

View full text Add to dashboard Cite

Graphene, an atomically thin two-dimensional (2D) material, exhibits outstanding electrical properties and thus has been employed in various electronic devices. However, the device performance strongly depends on the structural variations present in the graphitic lattice, such as crystal domains, grain boundaries, lattice imperfections, dopants, etc., which are nanoscopic in nature. Hence, understanding the correlation between the structure and the electrical properties in the nanoscale is essential. Atomic force microscopy (AFM) techniques provide the best way to picture such relationships, which is particularly in demand for future miniaturized devices. This review article highlights the characterization of the electrical properties of graphene-based materials via AFM-based techniques such as conductive AFM, scanning Kelvin probe microscopy, electrostatic force microscopy, and piezoresponse force microscopy that is certainly beneficial for a broad research community not only working on graphene-based materials but also in the fields of other 2D materials and scanning probe microscopy. Graphical abstract

show abstract

Section: Introduction To C-afmmentioning

confidence: 99%

Nanoscale electrical characterization of graphene-based materials by atomic force microscopy

Silva

Huang

Viswanath

et al. 2022

Journal of Materials Research

View full text Add to dashboard Cite

show abstract

“…Conduction at single asperity contacts can be measured experimentally using conductive atomic force microscopy (C-AFM). C-AFM has been used to study ECR of various material systems including thin SiO 2 films grown on doped Si substrates [21], HOPG [22,23], carbon nanotubes [24,25], self-assembled monolayers of organic molecules on gold [26], and gold islands on HOPG [27]. However, such studies have not investigated the time dependence of ECR at the nanoscale.…”

Section: Introductionmentioning

confidence: 99%

“…Alternatively, current can be approximated from reactive MD simulations using a method called EChemDID [35], that enables calculation of current from the electrochemical potential of atoms. This approach has been used to study conduction across nanoscale contacts previously [23,27,36,37]. Lastly, the relationship between atom-atom distance and conduction from first principles calculations can be fit to an empirical model which is then used with MD atom distances to estimate conduction [38].…”

Section: Introductionmentioning

confidence: 99%

Time-Dependent Electrical Contact Resistance at the Nanoscale

et al. 2021

Self Cite

View full text Add to dashboard Cite

Conductive-atomic force microscopy (C-AFM) and molecular dynamics (MD) simulations are used to investigate time-dependent electrical contact resistance (ECR) at the nanoscale. ECR is shown to decrease over time as measured using C-AFM and estimated using two approaches from MD simulations, although the experiments and simulations explore different time scales. The simulations show that time dependence of ECR is attributable to an increase in real contact area due to atoms diffusing into the contact. This diffusion-based aging is found to be a thermally activated process that depends on the local contact pressure. The results demonstrate that contact aging, previously identified as an important mechanism for friction, can significantly affect electrical conduction at the nanoscale. Graphical Abstract

show abstract

“Stick–slip” fluctuations in local electrical conductivity maps on graphite surfaces: A revisit

Wang,

Zhang,

2024

Applied Surface Science

View full text Add to dashboard Cite

Insights into dynamic sliding contacts from conductive atomic force microscopy

Abstract: Friction in nanoscale contacts is determined by the size and structure of the interface that is hidden between the contacting bodies. One approach to investigating the origins of friction is...

Cited by 4 publications

References 55 publications

Nanoscale electrical characterization of graphene-based materials by atomic force microscopy

Nanoscale electrical characterization of graphene-based materials by atomic force microscopy

Time-Dependent Electrical Contact Resistance at the Nanoscale

“Stick–slip” fluctuations in local electrical conductivity maps on graphite surfaces: A revisit

Contact Info

Product

Resources

About