2006
DOI: 10.1103/physrevb.74.035302
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Initial stage of the two-dimensional to three-dimensional transition of a strained SiGe layer on a pit-patterned Si(001) template

Abstract: We investigate the initial stage of the 2D-3D transition of strained Ge layers deposited on pit-patterned Si(001) templates. Within the pits, which assume the shape of inverted, truncated pyramids after optimized growth of a Si buffer layer, the Ge wetting layer develops a complex morphology consisting exclusively of {105} and (001) facets. These results are attributed to a strain-driven step-meandering instability on the facetted side-walls of the pits, and a step-bunching instability at the sharp concave int… Show more

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Cited by 69 publications
(77 citation statements)
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References 37 publications
(32 reference statements)
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“…First, the observation of such a phenomenon on pit-patterned substrates is easier with respect to flat substrates because the plastic relaxation is delayed. This is due to (i) the elastic-energy relaxation provided by the shallow pit filled with a Ge-poor SiGe alloy located below the island (a purely elastic effect) [15], (ii) the larger availability of Si flow from the faceted pit sidewalls which do not display a homogeneous wetting layer [27], and (iii) the effect of ordered pits in producing islands with very similar properties at all stages of growth. The latter prevents local composition and size fluctuations which are typical for growth on planar surfaces and are responsible for the occurrence of a few plastically relaxed islands even at relatively low Ge coverages [17].…”
Section: Sb Andmentioning
confidence: 99%
“…First, the observation of such a phenomenon on pit-patterned substrates is easier with respect to flat substrates because the plastic relaxation is delayed. This is due to (i) the elastic-energy relaxation provided by the shallow pit filled with a Ge-poor SiGe alloy located below the island (a purely elastic effect) [15], (ii) the larger availability of Si flow from the faceted pit sidewalls which do not display a homogeneous wetting layer [27], and (iii) the effect of ordered pits in producing islands with very similar properties at all stages of growth. The latter prevents local composition and size fluctuations which are typical for growth on planar surfaces and are responsible for the occurrence of a few plastically relaxed islands even at relatively low Ge coverages [17].…”
Section: Sb Andmentioning
confidence: 99%
“…11 However, the island formation and subsequent evolution on pit-patterned Si͑001͒ substrates are still not completely understood. While the initial stages of the twodimensional ͑2D͒ to 3D transition during Ge deposition on a pit-patterned Si͑001͒ surface have been recently studied, 12 a detailed investigation of the morphological changes occurring during island growth is still lacking.…”
Section: G Bauermentioning
confidence: 99%
“…1(b), the 551 and 100 intersection lines differ substantially in their atomic configuration. 31 The hut clusters on Si(001) are therefore also different from the {105}-terminated SiGe wire bundles into which a Ge wetting layer on (1 1 10) oriented Si substrates disintegrates, 32,33 because their ridges are 551 oriented. Accordingly, the base angles of the triangular cross sections amount to 11.3…”
Section: © 2014 Author(s) All Article Content Except Where Otherwismentioning
confidence: 99%
“…Simultaneously, we studied the influence of small substrate miscuts by employing a batch of 4 Si (001) The substrates were chemically pre-cleaned 37 and the residual oxide removed in 1% hydrofluoric acid before being loaded into a Riber Siva 45 MBE system. 32 The substrates were degassed in situ at 720…”
Section: © 2014 Author(s) All Article Content Except Where Otherwismentioning
confidence: 99%