2009
DOI: 10.1002/pssc.200881001
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Infrared study of the oxidation of porous silicon: evidence of surface modes

Abstract: The evolution of FTIR spectra of PS during oxidation is studied in the range 450‐1300 cm–1. We show that the small scale of the PS structure leads to a significant scattering cross section for Fröhlich surface modes associated to stretching modes in siloxane bridges. The kinetics of the evolution of both bulk‐ and surface‐related modes are studied using Principal Component Analysis. As a result, two independent components are found, one of them related to TO modes associated to silicon oxide covering large str… Show more

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Cited by 7 publications
(10 citation statements)
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“…The median particle diameter of SiMPs changed from 5.63 to 2.34 μm after ball milling, and the size of all particles decreased significantly (Figure S1a–c). And in Figure S1d, the peaks in FTIR spectra of the samples before and after ball milling are basically the same, and only the peaks at 3446 cm –1 ascribed from the stretching modes of Si–OH and 1101 cm –1 of the Si–O–Si bonds move toward lower wavenumbers and widen after ball milling, indicating the increase of −OH on the SiMP surface and the enhancement of hydrogen bonding, which will facilitate the interaction between silicon particles and the binder. , …”
Section: Resultsmentioning
confidence: 85%
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“…The median particle diameter of SiMPs changed from 5.63 to 2.34 μm after ball milling, and the size of all particles decreased significantly (Figure S1a–c). And in Figure S1d, the peaks in FTIR spectra of the samples before and after ball milling are basically the same, and only the peaks at 3446 cm –1 ascribed from the stretching modes of Si–OH and 1101 cm –1 of the Si–O–Si bonds move toward lower wavenumbers and widen after ball milling, indicating the increase of −OH on the SiMP surface and the enhancement of hydrogen bonding, which will facilitate the interaction between silicon particles and the binder. , …”
Section: Resultsmentioning
confidence: 85%
“…And in Figure S1d, the peaks in FTIR spectra of the samples before and after ball milling are basically the same, and only the peaks at 3446 cm −1 ascribed from the stretching modes of Si− OH and 1101 cm − increase of −OH on the SiMP surface and the enhancement of hydrogen bonding, which will facilitate the interaction between silicon particles and the binder. 33,34 3.2. Preparation and Characterization of the Binder.…”
Section: Pretreatment and Characterization Of The Simentioning
confidence: 99%
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“…Los procesos de funcionalización del SMP producen terminaciones de Si-(OH) x y Si-O que favorecen la inserción de moléculas polares al interior del SMP [29,30]. Para confirmar este hecho, obtuvimos espectros de absorbancia de las muestras.…”
Section: Silicio Macroporosounclassified
“…1 Introduction Using silicon wafers p-Si as material base and electrochemical anodizing process permit to obtained commonly a nanostructure semiconductor material [1,2]. The material produced is known as porous silicon (PS) [3,4].…”
mentioning
confidence: 99%