2002
DOI: 10.1109/3.998615
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Influence of Si-doping on the characteristics of InGaN-GaN multiple quantum-well blue light emitting diodes

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Cited by 151 publications
(49 citation statements)
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“…In Device I, only polarization induced charges are shown in Fig. 6(b), since there are no Si dopants in the quantum barriers and the simulated electron sheet charge density in the fifth quantum well is around 1.4 10 cm , which is negligible compared to the polarization charge density that is in the order of 10 cm [29]. Thus we obtain the macroscopic electric field in (1) at both "A" and "B" sites, respectively, which explains the field symmetry for Device I in Fig.…”
Section: Resultsmentioning
confidence: 99%
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“…In Device I, only polarization induced charges are shown in Fig. 6(b), since there are no Si dopants in the quantum barriers and the simulated electron sheet charge density in the fifth quantum well is around 1.4 10 cm , which is negligible compared to the polarization charge density that is in the order of 10 cm [29]. Thus we obtain the macroscopic electric field in (1) at both "A" and "B" sites, respectively, which explains the field symmetry for Device I in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Finally Ti/Au (30 nm/150 nm) was deposited on the n-GaN layer as the n-electrode. between the electron and hole wave functions [29], thus enhancing the radiative recombination rates. Nevertheless, in the low current regime (4.8 mA mA), Device II performs worse than Device I.…”
Section: Methodsmentioning
confidence: 99%
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“…In order to fabricate spintronic devices which have longer emission wavelengths, it is important to improve the quality of the InGaGdN/GaN interface. Wu and Cho et al have reported that Si-doping in the barrier of the InGaN/GaN MQW improved the crytalline quality [3,4]. Hence, we tried Si-doping into the barrier and grow the InGaGdN/GaN:Si MQW structures to confirm the effect of Si-doping.…”
mentioning
confidence: 95%