Influence of primary ion bombardment conditions on the emission of molecular secondary ions

Kersting, R.; Hagenhoff, Birgit; Kollmer, Felix; Möllers, R.; Niehuis, E.

doi:10.1016/j.apsusc.2004.03.057

Cited by 58 publications

(55 citation statements)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Previous studies show that the use of C 60 as a primary ion improves secondary ion yield (versus monatomic primary ions) between a factor of 13× and 300×. 34,[45][46][47][48][49] With a mild 50-fold improvement in secondary ion yield, the time needed for the experiment shown in Fig. 5 would be reduced from ∼3 h to only 3.6 min.…”

Section: Discussionmentioning

confidence: 99%

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

Kiss

Jungmann

Smith

et al. 2013

Review of Scientific Instruments

View full text Add to dashboard Cite

In-vacuum active pixel detectors enable high sensitivity, highly parallel time-and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with a secondary ion mass spectrometer for microscope mode secondary ion mass spectrometry (SIMS) imaging. Time resolved images from various benchmark samples demonstrate the imaging capabilities of the detector system. The main advantages of the active pixel detector are the higher signal-to-noise ratio and parallel acquisition of arrival time and position. Microscope mode SIMS imaging of biomolecules is demonstrated from tissue sections with the Timepix detector.

show abstract

Section: Discussionmentioning

confidence: 99%

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

Kiss

Jungmann

Smith

et al. 2013

Review of Scientific Instruments

View full text Add to dashboard Cite

show abstract

“…29,30 An excellent example of this is the data for the yield of the M H ion from Irganox 1010, deposited on low-density polyethylene (LDPE), given by Kollmer 4 and by Kersting et al 38 for Au 1 C , Au 2 C , and Au 3 C as shown in Figure 9(a).…”

Section: Static Simsmentioning

confidence: 96%

Analysis of cluster ion sputtering yields: correlation with the thermal spike model and implications for static secondary ion mass spectrometry

Seah

2007

Surface & Interface Analysis

View full text Add to dashboard Cite

An assessment is made of the behaviours in ion sputtering and static secondary ion mass spectrometry to provide a framework to understand the enhanced secondary ion yield of molecular fragments, from molecules on defined substrates, achieved by using primary ion clusters. First, an analysis is made of the published ion sputtering yield data for mono-elemental solids sputtered by mono-elemental primary ion clusters, mainly of the type Au n + . These are evaluated using Sigmund and Claussen's thermal spike model. That theory is shown to be consistent with, and an excellent description of, the published ion sputtering yields for elemental targets over a wide energy range for primary ion cluster sizes from 1 to 13 for gold primary ion clusters and for a number of different primary ion species. This theory is then used to evaluate the molecular ion yield behaviour of interest in static secondary ion mass spectrometry (SIMS). This is done for measurements on Irganox 1010. The thermal spike sputtering yield is first related to the total secondary ion yield. The secondary ion yield of the molecular ion, whether protonated or de-protonated, is then shown to be proportional to the square of the total secondary ion yield and hence to the square of the sputtering yield. This rule is valid for all primary ions, both single atom and cluster, over 5 decades of emission intensity, largely independent of the chemical identity of the primary ions for those data. This enables recommendations for future sources of higher efficiency for the analysis of organic materials.

show abstract

“…T he elucidation of the mechanism of interaction of energetic polyatomic or cluster ions with surfaces is of current interest since these projectiles are now being extensively employed as desorption probes in secondary ion mass spectrometry (SIMS) experiments [1,2]. Because of their propensity to produce higher molecular ion signals than corresponding atomic ions and the emergence of commercially available C 60 ϩ [3,4] and Au 3 ϩ [5,6] ion guns, applications have expanded dramatically. For example, these sources can be focused onto the sample with a probe size about 1 micron, allowing greatly improved molecule-specific imaging experiments.…”

mentioning

confidence: 99%

Energetic ion bombardment of Ag surfaces by C₆₀⁺ and Ga⁺ projectiles

Sun

Szakal

Winograd

et al. 2005

J. Am. Soc. Mass Spectrom.

View full text Add to dashboard Cite

The ion bombardment-induced release of particles from a metal surface is investigated using energetic fullerene cluster ions as projectiles. The total sputter yield as well as partial yields of neutral and charged monomers and clusters leaving the surface are measured and compared with corresponding data obtained with atomic projectile ions of similar impact kinetic energy. It is found that all yields are enhanced by about one order of magnitude under bombardment with the C 60 ϩ cluster projectiles compared with Ga ϩ ions. In contrast, the electronic excitation processes determining the secondary ion formation probability are unaffected. The kinetic energy spectra of sputtered particles exhibit characteristic differences which reflect the largely different nature of the sputtering process for both types of projectiles. In particular, it is found that under C 60 ϩ impact (1) the energy spectrum of sputtered atoms peaks at significantly lower kinetic energies than for Ga ϩ bombardment and (2) the velocity spectra of monomers and dimers are virtually identical, a finding which is in pronounced contrast to all published data obtained for atomic projectiles. T he elucidation of the mechanism of interaction of energetic polyatomic or cluster ions with surfaces is of current interest since these projectiles are now being extensively employed as desorption probes in secondary ion mass spectrometry (SIMS) experiments [1,2]. Because of their propensity to produce higher molecular ion signals than corresponding atomic ions and the emergence of commercially available C 60 ϩ [3,4] and Au 3 ϩ [5, 6] ion guns, applications have expanded dramatically. For example, these sources can be focused onto the sample with a probe size about 1 micron, allowing greatly improved molecule-specific imaging experiments. The high secondary ion yield associated with the cluster/solid interaction also allows for molecular depth profiling studies without the accompanying damage accumulation normally associated with atomic bombardment [7][8][9][10][11][12][13][14][15][16][17].The mechanisms associated with the observed secondary ion yield enhancement are not yet clear, although details are emerging quickly. A basic question that must be resolved is to determine whether the yield enhancement occurs as a consequence of increased ionization efficiency, or is due to more effective sputtering in the neutral desorption channel. There is mixed information about this point. For In and Ag surfaces, for example, it has been shown that the enhanced secondary ion yield under SF m ϩ bombardment (m ϭ 1-5) largely arises from the enhanced ionization efficiency attributable to implanted F atoms [18]. For organic systems, however, very high removal rates of neutral species have been reported [2], obviating the need to invoke enhancement of the secondary ionization probability. Most recently, yields and velocity distributions were measured for In and In 2 sputtered from In surfaces bombarded with Au ϩ , Au 2 ϩ , and Au 3 ϩ [19]. Although these experiments do not ad...

show abstract

Influence of primary ion bombardment conditions on the emission of molecular secondary ions

Cited by 58 publications

References 2 publications

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

Analysis of cluster ion sputtering yields: correlation with the thermal spike model and implications for static secondary ion mass spectrometry

Energetic ion bombardment of Ag surfaces by C₆₀⁺ and Ga⁺ projectiles

Contact Info

Product

Resources

About

Influence of primary ion bombardment conditions on the emission of molecular secondary ions

Cited by 58 publications

References 2 publications

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

Analysis of cluster ion sputtering yields: correlation with the thermal spike model and implications for static secondary ion mass spectrometry

Energetic ion bombardment of Ag surfaces by C60+ and Ga+ projectiles

Contact Info

Product

Resources

About

Energetic ion bombardment of Ag surfaces by C₆₀⁺ and Ga⁺ projectiles