2012
DOI: 10.1063/1.3691950
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Influence of plasma-generated negative oxygen ion impingement on magnetron sputtered amorphous SiO2 thin films during growth at low temperatures

Abstract: Influence of the plasma pressure on the microstructure and on the optical and mechanical properties of amorphous carbon films deposited by direct current magnetron sputtering J. Vac Growth of amorphous SiO 2 thin films deposited by reactive magnetron sputtering at low temperatures has been studied under different oxygen partial pressure conditions. Film microstructures varied from coalescent vertical column-like to homogeneous compact microstructures, possessing all similar refractive indexes. A discussion on … Show more

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Cited by 30 publications
(26 citation statements)
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References 36 publications
(39 reference statements)
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“…From this, it is known that classical MS depositions, in which the growth surface is parallel to the target, usually yield dense and compact films, thanks mostly to the high energy of the deposition particles and the impingement of plasma ions during growth [296,297]. In contrast, when deposition is carried out in an OAD configuration, other processes may play important roles in the development of columnar and porous nanostructures [212].…”
Section: Magnetron Sputtering Deposition At Oblique Anglesmentioning
confidence: 98%
“…From this, it is known that classical MS depositions, in which the growth surface is parallel to the target, usually yield dense and compact films, thanks mostly to the high energy of the deposition particles and the impingement of plasma ions during growth [296,297]. In contrast, when deposition is carried out in an OAD configuration, other processes may play important roles in the development of columnar and porous nanostructures [212].…”
Section: Magnetron Sputtering Deposition At Oblique Anglesmentioning
confidence: 98%
“…For instance, in refs. , we studied the influence of some experimental controllable parameters (e.g. deposition pressure, tilt angle of the substrate, ion impingement, etc.)…”
Section: Introductionmentioning
confidence: 99%
“…The fact that removal of cracks propagation occurred with SiO 2 ‐0° but not with TiO 2 ‐0° was accounted for by the impingement of highly energetic negative ions of oxygen formed in the plasma during the MS deposition of SiO 2 but not TiO 2. A singular effect of this enhanced ion bombardment is the formation of a homogeneous and compact SiO 2 layer with a low surface roughness (see AFM images in Figure S6 in the Supporting Information) on which a TiO 2 ‐0° film may grow in compact form with no cracks (see Figure S4 in the Supporting Information).…”
Section: Resultsmentioning
confidence: 99%