2008
DOI: 10.1063/1.2964119
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Improvement of a dynamic scanning force microscope for highest resolution imaging in ultrahigh vacuum

Abstract: We report on a modification of a commercial scanning force microscope (Omicron UHV AFM/STM) operated in noncontact mode (NC-AFM) at room temperature in ultrahigh vacuum yielding a decrease in the spectral noise density from 2757 to 272 fm/Hz. The major part of the noise reduction is achieved by an exchange of the originally installed light emitting diode by a laser diode placed outside the vacuum, where the light is coupled into the ultrahigh vacuum chamber via an optical fiber. The setup is further improved b… Show more

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Cited by 24 publications
(17 citation statements)
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“…The self-oscillating mode was replaced by a phase locked loop (PLL) setup from Nanosurf (easyscan2, Nanosurf, Woburn, MA, USA). The sensitivity and the signal-to-noise ratio were increased by replacing the internal laser diode by an external one combined with a replacement of the preamplifier of the position-sensitive diode signal, according to the concept of Torbrugge et al [24]. …”
Section: Methodsmentioning
confidence: 99%
“…The self-oscillating mode was replaced by a phase locked loop (PLL) setup from Nanosurf (easyscan2, Nanosurf, Woburn, MA, USA). The sensitivity and the signal-to-noise ratio were increased by replacing the internal laser diode by an external one combined with a replacement of the preamplifier of the position-sensitive diode signal, according to the concept of Torbrugge et al [24]. …”
Section: Methodsmentioning
confidence: 99%
“…Experiments are carried out in an ultrahigh vacuum system at a base pressure of 1 × 10 -10 mbar with a modified commercial scanning force microscope 28 operated at room temperature in the noncontact mode of operation (NC-AFM), 29 keeping the cantilever oscillation amplitude constant at a level of 45 nm and the tip-surface electrostatic interaction minimized. 30 We use p-doped silicon cantilevers (PPP-QFMR, Nanosensors, Neuchatel, Switzerland) having a nominal spring constant of about 2.8 N/m, a resonance frequency of typically 70 kHz, and quality factors exceeding 30 000.…”
Section: Methodsmentioning
confidence: 99%
“…The detection-system noise represented by is governed by the quality of the optical and electronic components used in the detection system. In contrast to thermal noise, which is a fixed quantity for a given cantilever and temperature, the detection-system noise floor can be reduced by technical improvements of the detection system [3,78]. …”
Section: Introductionmentioning
confidence: 99%