2007
DOI: 10.1063/1.2825577
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Impact of strain on free-exciton resonance energies in wurtzite AlN

Abstract: The strain dependence of the free-exciton resonance energies in AlN epilayers is presented and the values are analyzed using an appropriate Hamiltonian assuming equibiaxial stress for the wurtzite crystal structure in order to obtain valence band parameters. Based on the results, we study the strain dependence of the valence band ordering, optical transition probability, and free-exciton binding energy. As a result of these calculations, the following strain-free values are obtained for the energy gap, average… Show more

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Cited by 48 publications
(38 citation statements)
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“…According to reference [4], 0.868 appears to be the value the most compatible with experimental reports, compared to the alternate 0.833 value. There o many digits in these ratio and using one or another just leads to a non impacting 4 percent change in γ.…”
Section: -P3supporting
confidence: 69%
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“…According to reference [4], 0.868 appears to be the value the most compatible with experimental reports, compared to the alternate 0.833 value. There o many digits in these ratio and using one or another just leads to a non impacting 4 percent change in γ.…”
Section: -P3supporting
confidence: 69%
“…The crystal field splitting of bulk AlN has been identified as being negative contrarily to the GaN, InN and CdS case [3], which gives an interesting and well marked anisotropy of the optical response of this material. The optical properties of epilayers are in addition modified in relation with builtin strain fields and experimental values of the excitonic deformation potentials were recently proposed [4][5][6][7]. The evolution of the optical properties of AlN epilayers grown on various substrates are now well accounted for by models which were fruitfully applied to GaN [8], ZnO [9].…”
Section: Introductionmentioning
confidence: 99%
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“…The ratio ε S⊥ /ε S is 0.831, which is only slightly lower than estimated earlier. 38 The geometric mean value ε S = √ ε S⊥ ε S = 8.39 is frequently used as an estimate of an isotropic equivalent for the static dielectric constant.…”
Section: B High-frequency and Static Dielectric Constantsmentioning
confidence: 99%