2014
DOI: 10.1103/physrevb.89.205407
|View full text |Cite
|
Sign up to set email alerts
|

Image correction for atomic force microscopy images with functionalized tips

Abstract: It has been demonstrated that atomic force microscopy imaging with CO-functionalized tips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the tip apex is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems.

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

5
68
0

Year Published

2014
2014
2024
2024

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 62 publications
(74 citation statements)
references
References 34 publications
5
68
0
Order By: Relevance
“…Note that traditional STHM achieves geometric contrast at low bias voltages of approximately +10 to 30 mV, because the close tip–sample approach is necessary to trap hydrogen molecules below the tip . With this close approach, there should thus be similar deviations from real bond lengths as observed with tip‐modified nc‐AFM, in which the deviations are up to 100 %, similar to that observed here at small voltage. By being able to image at higher bias voltage here, we reduce the deviation to less than 30 %.…”
Section: Resultssupporting
confidence: 77%
See 1 more Smart Citation
“…Note that traditional STHM achieves geometric contrast at low bias voltages of approximately +10 to 30 mV, because the close tip–sample approach is necessary to trap hydrogen molecules below the tip . With this close approach, there should thus be similar deviations from real bond lengths as observed with tip‐modified nc‐AFM, in which the deviations are up to 100 %, similar to that observed here at small voltage. By being able to image at higher bias voltage here, we reduce the deviation to less than 30 %.…”
Section: Resultssupporting
confidence: 77%
“…In order to understand the difference in apparent diameter, we reiterate that the interaction of the probe molecule with the surface is of importance to understand image distortion in tip‐modified nc‐AFM . Likewise, the hydrogen molecules here do not only interact with the radicals, but also with the surface on which they have preferred binding sites.…”
Section: Resultsmentioning
confidence: 99%
“…The sharp ridges observed in the intramolecular region often mimics the internal molecular structure [5], with only few exceptions [6,7]. The capability of AFM/STM to resolve internal atomic and chemical structure in real space opened new horizons for the characterization of molecules and surfaces [5,[8][9][10][11][12][13][14][15] at atomic scale.The origin of high resolution of molecular structures in AFM has been attributed to Pauli repulsion [2,16] and the bending of the functionalized tip apex [5]. Recently, we introduced a numerical model [7] which provides a unified insight into the detailed mechanism of the high resolution imaging with decorated tips in both AFM and STM.…”
mentioning
confidence: 99%
“…The sharp ridges observed in the intramolecular region often mimics the internal molecular structure [5], with only few exceptions [6,7]. The capability of AFM/STM to resolve internal atomic and chemical structure in real space opened new horizons for the characterization of molecules and surfaces [5,[8][9][10][11][12][13][14][15] at atomic scale.…”
mentioning
confidence: 99%
“…This artifact is commonly observed in the nc-AFM imaging with CO tips. It varies for different substrate materials, and has been assigned to the lateral forces bending the flexible CO molecule at the tip[21,13].…”
mentioning
confidence: 99%