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ABSTRACTThis paper is concerned with a stochastic inverse methodology arising in electromagnetic imaging. Nondestructive testing using guided microwaves covers a wide range of industrial applications including early detection of anomalies in conducting materials. The focus of this paper is the identification of electromagnetic material parameters and emphasis is on one dimensional scattering of a dielectric slab. The direct problem can be solved numerically using the finitedifference time-domain method (FDTD). The Markov Chain Monte Carlo method (MCMC) is applied to the inversion problem. Some successful results of computational experiments are demonstrated in order to show the feasibility and applicability of the proposed method.
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