2020
DOI: 10.3390/rs12213555
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Ice Monitoring in Swiss Lakes from Optical Satellites and Webcams Using Machine Learning

Abstract: Continuous observation of climate indicators, such as trends in lake freezing, is important to understand the dynamics of the local and global climate system. Consequently, lake ice has been included among the Essential Climate Variables (ECVs) of the Global Climate Observing System (GCOS), and there is a need to set up operational monitoring capabilities. Multi-temporal satellite images and publicly available webcam streams are among the viable data sources capable of monitoring lake ice. In this work we inve… Show more

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Cited by 9 publications
(22 citation statements)
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References 38 publications
(79 reference statements)
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“…When comparing the results on Table VI from different satellite remote sensing methods ( [13], [11]) methods, the joint embedding model, on average, deviates least from the ground truth. However, the results of in-situ temperature analysis [9], are better.…”
Section: Ice-on/off Resultsmentioning
confidence: 99%
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“…When comparing the results on Table VI from different satellite remote sensing methods ( [13], [11]) methods, the joint embedding model, on average, deviates least from the ground truth. However, the results of in-situ temperature analysis [9], are better.…”
Section: Ice-on/off Resultsmentioning
confidence: 99%
“…We have developed a deep learning framework that learns a sensor-invariant embedding in order to fuse MODIS, VIIRS and S1-SAR satellite data into a task-specific, homogenised TABLE VI: Ice-on/off dates (winter 2016-17) estimated with the 2-step model, with two different thresholds. For comparison we show the ground truth (in chronological order when more than one candidate exists), the earlier remote sensing results ( [11], [13]), and the results of in-situ (temperature, T) analysis [9]. Results that meet the GCOS requirement are printed bold.…”
Section: Discussionmentioning
confidence: 99%
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“…Their electrical characteristics are greatly affected by ambient temperature and are more sensitive. Temperature changes can cause changes in the conductivity of semiconductor devices [25,26]. This characteristic can be applied to defect location in integrated circuits.…”
Section: Analysis Of Detecting Integrated Circuitmentioning
confidence: 99%