1993
DOI: 10.1016/0038-1098(93)90368-w
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Hydrogen-acceptor pairing in CdTe epitaxial layers grown by OMVPE

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Cited by 25 publications
(12 citation statements)
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“…A short anneal (<60 s) at 400°C to 500°C led to a significant increase in electrical activity to $10 17 cm -3 , which corresponded with a decrease in the concentration of As-H pairs. Clerjaud et al 69 showed that more hydrogen was incorporated in the As-doped than the undoped part of the structure. The same group also determined that the H in undoped CdTe was coming from the MOVPE precursors.…”
Section: Hydrogen In Semiconductorsmentioning
confidence: 99%
“…A short anneal (<60 s) at 400°C to 500°C led to a significant increase in electrical activity to $10 17 cm -3 , which corresponded with a decrease in the concentration of As-H pairs. Clerjaud et al 69 showed that more hydrogen was incorporated in the As-doped than the undoped part of the structure. The same group also determined that the H in undoped CdTe was coming from the MOVPE precursors.…”
Section: Hydrogen In Semiconductorsmentioning
confidence: 99%
“…These results have been obtained either in OMVPE grown samples in which hydrogen was non intentional [11,17,18,20,21] or in samples in which hydrogen had been intentionally introduced either during the MBE growth [16] or by exposition to a hydrogen or deuterium radio frequency plasma [19]. In the case of arsenic in ZnSe, deuterium had been also substituted to hydrogen as the carrier gas and in this case, the deuterium related mode has also been reported [21].…”
mentioning
confidence: 90%
“…2 as an example [20]. In the cases of 500 CdTe : As Te 2022 stretching [11] the nitrogen acceptor in ZnSe and CdTe, a transverse mode of the complex has been seen in addition to the stretching mode. All of the transitions reported in Table 1 have been observed by infrared spectroscopy.…”
mentioning
confidence: 94%
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