The
neutral, distorted octahedral complex [TiCl4(SenBu2)2] (1), prepared
from the reaction of TiCl4 with the neutral SenBu2 in a 1:2 ratio and characterized by
IR and multinuclear (1H, 13C{1H}, 77Se{1H}) NMR spectroscopy and microanalysis, serves
as an efficient single-source precursor for low-pressure chemical
vapor deposition (LPCVD) of titanium diselenide, TiSe2,
films onto SiO2 and TiN substrates. X-ray diffraction patterns
on the deposited films are consistent with single-phase, hexagonal
1T-TiSe2 (P3̅m1),
with evidence of some preferred orientation of the crystallites in
thicker films. The composition and structural morphology was confirmed
by scanning electron microscopy (SEM), energy dispersive X-ray, and
Raman spectroscopy. SEM imaging shows hexagonal plate crystallites
growing perpendicular to the substrate, but these tend to align parallel
to the surface when the quantity of reagent is reduced. The resistivity
of the crystalline TiSe2 films is 3.36 ± 0.05 ×
10–3 Ω·cm with a carrier density of 1
× 1022 cm–3. Very highly selective
film growth from the reagent was observed onto photolithographically
patterned substrates, with film growth strongly preferred onto the
conducting TiN surfaces of SiO2/TiN patterned substrates.
TiSe2 is selectively deposited within the smallest 2 μm
diameter TiN holes of the patterned TiN/SiO2 substrates.
The variation in crystallite size with different diameter holes is
determined by microfocus X-ray diffraction and SEM, revealing that
the dimensions increase with the hole size, but that the thickness
of the crystals stops increasing above ∼20 μm hole size,
whereas their lengths/widths continue to increase.