2003
DOI: 10.1149/1.1587728
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High-Performance Silicon Etching Using Chlorine Trifluoride Gas

Abstract: The silicon etching rate by chlorine trifluoride gas is systematically studied using a reactor having a very small cross section above the silicon substrate and achieving a very high efficiency of etchant gas consumption and very large etching rate, larger than 20 m min Ϫ1 . The silicon etching rate is shown to be proportional to the flow rate of the chlorine trifluoride gas. However, this rate is, for the first time, found to be independent of the initial silicon substrate temperature. This study shows that t… Show more

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Cited by 20 publications
(43 citation statements)
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“…The gas flow channel above the substrate of this reactor has a small rectangular cross-section in order to achieve a very high consumption efficiency of the reactive gases. The height and the width of the quartz chamber are 10 and 40 mm, respectively, similar to those in our previous studies of various processes [14,21,22]. The gas supply system has the function of introducing gases, such as hydrogen, nitrogen, monomethylsilane, hydrogen chloride and chlorine trifluoride.…”
Section: Methodssupporting
confidence: 64%
See 1 more Smart Citation
“…The gas flow channel above the substrate of this reactor has a small rectangular cross-section in order to achieve a very high consumption efficiency of the reactive gases. The height and the width of the quartz chamber are 10 and 40 mm, respectively, similar to those in our previous studies of various processes [14,21,22]. The gas supply system has the function of introducing gases, such as hydrogen, nitrogen, monomethylsilane, hydrogen chloride and chlorine trifluoride.…”
Section: Methodssupporting
confidence: 64%
“…Hydrogen gas is used as the carrier gas. This gas is also used to remove the silicon oxide film and organic contamination that exist on the silicon substrate surface [21] immediately before the film deposition. Chlorine trifluoride gas is used in order to remove the silicon carbide film deposited on the inner wall of the quartz chamber.…”
Section: Methodsmentioning
confidence: 99%
“…16 To etch a semiconductor silicon surface using chlorine trifluoride gas, the horizontal cold-wall reactor shown in Fig. 1 is used.…”
Section: Methodsmentioning
confidence: 99%
“…7 on the silicon substrate surface are considered in the boundary conditions at the silicon substrate surface. Taking into account the experimental results, 16 the overall reaction shown in Eq. 7 is assumed to be a first-order reaction.…”
Section: Numerical Calculationmentioning
confidence: 99%
“…Because the silicon etch rate by chlorine trifluoride gas is quite high, [20][21][22] the etching rate is expected to increase with the increasing silicon content. Next, region C is considered to be 3C-silicon carbide, because the color yellow is characteristic of 3C-silicon carbide.…”
Section: Resultsmentioning
confidence: 99%