“…The influence of preparation conditions on the microstructure and on the solar selective properties of these oxides and layered coatings is investigated [1,3]. A large array of characterisation techniques of surface and interface analysis using advanced surface analysis systems (including XPS, AES, XRD, SEM; TEM, AFM, STM, UPS) is employed [1,4,9,10,12]. Further, we introduce the issue of roughness measurement and microtopographic evaluation of coatings's final materials as a quality nondestructive evaluation [1].…”