2007
DOI: 10.1117/12.734814
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HEW simulations and quantification of the microroughness requirements for x-ray telescopes by means of numerical and analytical methods

Abstract: Future X-ray telescopes like SIMBOL-X will operate in a wide band of the X-ray spectrum (from 0.1 to 80 keV); these telescopes will extend the optical performances of the existing soft X-ray telescopes to the hard X-ray band, and in particular they will be characterized by a angular resolution (conveniently expressed in terms of HEW, Half-EnergyWidth) less than 20 arcsec. However, it is well known that the microroughness of the reflecting surfaces of the optics causes the scattering of X-rays. As a consequence… Show more

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Cited by 3 publications
(6 citation statements)
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“…This approach is derived from the well-known Debye-Waller formula and offers the advantage to allow a quick computation of the HEW as a function of the photon energy. This method has also been confirmed numerically using the SIMBOL-X X-ray telescope as a test case [16] . There are, indeed, some limitations:…”
Section: The Hew Of a Single Mirrormentioning
confidence: 74%
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“…This approach is derived from the well-known Debye-Waller formula and offers the advantage to allow a quick computation of the HEW as a function of the photon energy. This method has also been confirmed numerically using the SIMBOL-X X-ray telescope as a test case [16] . There are, indeed, some limitations:…”
Section: The Hew Of a Single Mirrormentioning
confidence: 74%
“…It is convenient, instead, to perform the inverse computation, by estimating the increase in the HEW from the known surface finishing of mirror substrates. The adopted method, already adopted in previous works [16], [17] , is discussed in Sect. 2.…”
Section: Introductionmentioning
confidence: 99%
“…9. Notice that a similar calculation was also done in another paper of this volume 14 : unlike that case, however, here we did not set a maximum value for the scattering angles by modifying the upper integration limit of Eq. 3.…”
Section: Hew Simulations For Simbol-xmentioning
confidence: 99%
“…The factor ln(4/3) is related to the choice of a double reflection mirror. The results of these equations can be compared with ray-tracing numerical routines, properly modified in order to allow for X-ray scattering due to surface roughness 14 . The Eq.…”
Section: Evaluation Of Xrs Impact On the Hew For X-ray Mirror Modulesmentioning
confidence: 99%
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