Helium Nanobubbles Enhance Superelasticity and Retard Shear Localization in Small-Volume Shape Memory Alloy

Han, Wei‐Zhong; Zhang, Jian; Ding, Ming-Shuai; Lv, Lan; Wang, Wenhong; Wu, Guangheng; Shan, Zhiwei; Li, Ju

doi:10.1021/acs.nanolett.7b01015

Cited by 28 publications

(15 citation statements)

References 37 publications

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“…Hence, nano/micro-mechanical tests are widely adopted to evaluate He bubble induced hardening in these sample. Nanoindentation [63,116,117], and in situ mechanical testing in SEM [118,119,120,121] and TEM [122,123,124,125,126,127] are widely performed to investigate the effect of He bubbles on the mechanical properties of various metals. We mainly focus on three parts next: He irradiation hardening in single-phase metals, He irradiation hardening in metallic multilayers and theoretical modeling of He irradiation hardening.…”

Section: Helium Radiation Hardeningmentioning

confidence: 99%

Radiation-Induced Helium Bubbles in Metals

Han

2019

Materials

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Helium (He) bubbles are typical radiation defects in structural materials in nuclear reactors after high dose energetic particle irradiation. In the past decades, extensive studies have been conducted to explore the dynamic evolution of He bubbles under various conditions and to investigate He-induced hardening and embrittlement. In this review, we summarize the current understanding of the behavior of He bubbles in metals; overview the mechanisms of He bubble nucleation, growth, and coarsening; introduce the latest methods of He control by using interfaces in nanocrystalline metals and metallic multilayers; analyze the effects of He bubbles on strength and ductility of metals; and point out some remaining questions related to He bubbles that are crucial for design of advanced radiation-tolerant materials.

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Section: Helium Radiation Hardeningmentioning

confidence: 99%

Radiation-Induced Helium Bubbles in Metals

Han

2019

Materials

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“…Conversely, the samples with polyslip orientation, marked on lines (011)-(111) and (001)-(111), can deform either by twinning or full dislocation slip. [55] It should be mentioned that the size effect observed in NB-Cu pillars is different from the very weak size effect observed in pillars containing shear-resistant particles [56][57][58][59][60] as the current NB-Cu pillar contains helium bubbles can be cut through by dislocations at elevated stresses, which could induce some extent of size-dependence as the Cu pillars containing high density of irradiation induced stacking fault tetrahedrals. In that context, the CRSS for twinning, detwinning and slipping in NB-Cu and FD-Cu single crystals under compressive or tensile loading is plotted as a function of sample size in Figure 5b.…”

Section: Orientation and Sample Size Effect On Plasticity Of Helium Imentioning

confidence: 99%

“…Second, the CRSS of both NB-Cu and FD-Cu submicron-sized pillars, in general, exhibits some size-dependence, such that smaller appears to be stronger. [55] It should be mentioned that the size effect observed in NB-Cu pillars is different from the very weak size effect observed in pillars containing shear-resistant particles [56][57][58][59][60] as the current NB-Cu pillar contains helium bubbles can be cut through by dislocations at elevated stresses, which could induce some extent of size-dependence as the Cu pillars containing high density of irradiation induced stacking fault tetrahedrals. [61] Third, the CRSS measured in tension is lower than that in compression for both submicron-sized NB-Cu and FD-Cu pillars, suggesting that the loading configuration/geometrical effect has a marked influence on their yield strength and plasticity.…”

Section: Orientation and Sample Size Effect On Plasticity Of Helium Imentioning

confidence: 99%

In Situ Study of Deformation Twinning and Detwinning in Helium Irradiated Small‐Volume Copper

et al. 2017

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The influence of nanoscale helium bubbles on the deformation twinning and detwinning behavior of submicron‐sized Cu is investigated under tension, compression, and cyclic loading. In situ nanomechanical tests performed inside a transmission electron microscope reveal that twinning and detwinning occur readily in helium irradiated copper under both tension and compression. Continuous shearing of helium bubbles by Shockley partials leads to twin formation, whereas the residual back‐stress accumulated from dislocation‐bubble interactions assist in detwinning. These interactions also elevate the critical shear stress for partial dislocation slip in helium irradiated Cu compared to that in fully dense Cu. The growth twin boundaries can significantly enhance the twinning stress in helium irradiated Cu pillar, and deformation twin‐growth twin boundary interaction promotes the formation of internal crack and thus accelerates failure. The effect of crystallographic orientation and sample size on the overall deformation characteristics of helium irradiated Cu is briefly discussed. The current studies show that deformation twinning and detwinning are also active deformation models in helium irradiated small‐volume copper.

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“…www.nature.com/scientificreports www.nature.com/scientificreports/ enhance the ductility 32 and sometimes even leads to superelasticity 37 . Some studies have explored the effects of Ga + and He + irradiation on the microstructures and mechanical properties of materials 5,[30][31][32][34][35][36][37][38][39] . However, little effort has been made to understand how Xe + affects the microstructures and mechanical properties of sub-micron-sized samples.…”

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confidence: 99%

Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples

Liu

Niu

et al. 2020

Sci Rep

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The development of xenon plasma focused ion-beam (Xe + PFIB) milling technique enables sitespecific sample preparation with milling rates several times larger than the conventional gallium focused ion-beam (Ga + FIB) technique. As such, the effect of higher beam currents and the heavier ions utilized in the Xe + PFIB system is of particular importance when investigating material properties. To investigate potential artifacts resulting from these new parameters, a comparative study is performed on transmission electron microscopy (TEM) samples prepared via Xe + PFIB and Ga + FIB systems. Utilizing samples prepared with each system, the mechanical properties of CrMnFeCoNi high-entropy alloy (HEA) samples are evaluated with in situ tensile straining TEM studies. The results show that HEA samples prepared by Xe + PFIB present better ductility but lower strength than those prepared by Ga + FIB. This is due to the small ion-irradiated volumes and the insignificant alloying effect brought by Xe irradiation. Overall, these results demonstrate that Xe + PFIB systems allow for a more efficient material removal rate while imparting less damage to HEAs than conventional Ga + FIB systems. The rapid development of micro-electromechanical systems (MEMS) and nano-electromechanical systems (NEMS), which utilize materials at the micron scale and below, has resulted in a growing number of potential applications in electronic devices 1. Mechanical properties are of particular importance for applications in M/NEMS as efforts seek to improve the functionality and reliability of advanced electronic devices. Continuing efforts have focused on understanding how the mechanical properties of these materials change with decreasing dimensions 2-6. To facilitate this understanding, in situ straining transmission electron microscopy (TEM) is commonly used to test the mechanical properties 7-10 and observe deformation mechanisms 11-17 of small-sized samples. In situ straining TEM allows for simultaneous structural characterisation and mechanical property testing 13,15,18 , providing opportunities for building direct relationships between microstructure, deformation mechanisms, and mechanical properties of small-sized materials. Sample preparation is of particular importance when studying small-sized materials in the TEM 19. Traditionally, these TEM samples are prepared using a focused ion-beam (FIB) with a gallium ion (Ga +) source to thin samples from bulk to ~100 nm 20-26. Despite technological advances, the material removal rates of Ga + FIB systems have remained too low for researchers hoping to increase sample preparation efficiency 27. To help facilitate more efficient sample preparation, researchers have developed FIB systems with alternative ion sources such as the Xe + plasma FIB (Xe + PFIB) 27. As an alternative to Ga + ions, Xe + PFIB systems utilize inert Xe gas as the milling media resulting in material removal rates around six times larger than for Ga + mills 27 , which enables the preparation of samples with larger dimensions. On...

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Helium Nanobubbles Enhance Superelasticity and Retard Shear Localization in Small-Volume Shape Memory Alloy

Cited by 28 publications

References 37 publications

Radiation-Induced Helium Bubbles in Metals

Radiation-Induced Helium Bubbles in Metals

In Situ Study of Deformation Twinning and Detwinning in Helium Irradiated Small‐Volume Copper

Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples

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