2019
DOI: 10.1021/acsnano.9b06846
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Gate-Induced Metal–Insulator Transition in 2D van der Waals Layers of Copper Indium Selenide Based Field-Effect Transistors

Abstract: I. Y-function Method for estimating contact resistance. Y-function method, as first demonstrated by Ghibaudo 1 and modified by Chang et.al, 2 to include gate dependent Schottky barrier, was used to evaluate low-field mobility (μ0) and estimate effective contact resistance (RC) in strong inversion region (Vg >> Vd). Detailed derivation of Yfunction method can be found in ref 2. For low-field bias condition (Vg >> 0.5Vd), drain current can be writes as Equation S.I.1, (S.I.1) where all symbols carry their usual … Show more

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Cited by 22 publications
(45 citation statements)
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“…In the past, some efforts have been made to explain the MIT in 2D MoS 2 , [ 23–26 ] ReS 2 , [ 27 ] CuInSe, [ 28 ] and WSe 2 . [ 29 ] However, most of these studies were limited to a certain channel thickness.…”
Section: Introductionmentioning
confidence: 99%
“…In the past, some efforts have been made to explain the MIT in 2D MoS 2 , [ 23–26 ] ReS 2 , [ 27 ] CuInSe, [ 28 ] and WSe 2 . [ 29 ] However, most of these studies were limited to a certain channel thickness.…”
Section: Introductionmentioning
confidence: 99%
“…The remarkable features of metal selenide nanoparticles include their surface-to-volume ratios, optical and field emission properties, and photocatalytic activity. Based on these properties, metal selenides are being exploited in various fields including field-effect transistors [453], light-emitting diodes (LED) [454], solar cells [455], and wastewater remediation [456]. The commonly utilized metal selenides include ZnSe [457], CdSe [458], SnSe [459], PbSe [460], FeSe 2 [461], CuSe [462], and CdTe [463].…”
Section: Functionalized Metal Selenide Nanomaterialsmentioning
confidence: 99%
“…The field effect mobility of the CIS nanoflakes was estimated to be 30.4 cm 2 V −1 s −1 , which was comparable with that of mechanically exfoliated CuIn 7 Se 11 . [28,47] As shown in Figure 3d, the devices also exhibited a type of current rectification behavior, which was much obvious at V G = 0 V (Figure 3e). The rectification coefficient of the device was calculated to be ≈120 at V DS = ±3 V. To investigate the nature of the contact between graphene and the CIS nanoflake, Kelvin probe force microscopy (KPFM) was performed to measure the surface potential across the graphene/CIS interface.…”
Section: Resultsmentioning
confidence: 77%
“…The field effect mobility of the CIS nanoflakes was estimated to be 30.4 cm 2 V −1 s −1 , which was comparable with that of mechanically exfoliated CuIn 7 Se 11 . [ 28,47 ]…”
Section: Resultsmentioning
confidence: 99%