Functionality Demonstration of a High-Density 2.5V Self-Aligned Split-Gate NVM Cell Embedded into 40nm CMOS Logic Process for Automotive Microcontrollers

Luo, Laiqiang; Teo, Ziqiang; Kong, Yachen; Deng, F.; Liu, J. Q.; Zhang, F.; Cai, X.S.; Tan, K.M.; Lim, Kenneth Yang Teck; Khoo, P.; Jung, Sunghyun; Siah, S. Y.; Shum, D.; Wang, C. M.; Xing, Jianchun; Liu, G. Y.; Diao, Yanlei; Lin, Gray; Tee, L.; Lemke, Steven; Ghazavi, P.; Liu, X.; Do, Nhan; Pey, K. L.; Shubhakar, K.

doi:10.1109/imw.2016.7495271

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Functionality Demonstration of a High-Density 2.5V Self-Aligned Split-Gate NVM Cell Embedded into 40nm CMOS Logic Process for Automotive Microcontrollers

Cited by 8 publications

References 4 publications

Flash: A “Forgotten” Technology in VLSI Design

Flash: A “Forgotten” Technology in VLSI Design

eNVM Technologies Scaling Outlook and Emerging NVM Technologies for Embedded Applications

A Detailed Analysis of Hot-Electron Programming Efficiency in 40-nm Split-Gate Flash Memory Cells

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