DOI: 10.1109/date.2003.1253736
View full text
|
|
Share

Abstract: Microprocessor cores are a major challenge in the test arena: not only is their complexity always increasing, but also their specific characteristics intensify all difficulties. A microprocessor embedded inside a SOC is even harder to test since its input might be harder to control and its behavior may be harder to observe. Functional testing is an effective solution which consists in forcing the microprocessor to execute a suitable test program. This paper presents a new approach to automatic test program ge…

expand abstract