fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy

Tkadletz, Michael; Schiester, Maximilian; Waldl, Helene; Schusser, Georg; Krause, Michael; Schalk, Nina

doi:10.1016/j.mtcomm.2024.108672

Materials Today Communications

2024

DOI: 10.1016/j.mtcomm.2024.108672

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fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy

Michael Tkadletz,

Maximilian Schiester,

Helene Waldl

et al.

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fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy

Cited by 0 publications

References 22 publications

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