Fringe-pattern analysis using a 2-D Fourier transform

Bone, Don; Bachor, Hans‐A.; Sandeman, R. J.

doi:10.1364/ao.25.001653

Cited by 307 publications

(133 citation statements)

References 4 publications

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“…The method was first introduced by Takeda et al [23] and adapted by Bone et al [32], who provided a full 2D version. This technique was applied a decade later to lattice-distortion measurement in crystallography [31,33], achieving excellent results [34].…”

Section: Techniquesmentioning

confidence: 99%

High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

Sales

Beltrán

Lozano

et al. 2012

Semiconductor Research

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This chapter briefly describes the fundamentals of high-resolution electron microscopy techniques. In particular, the Peak Pairs approach for strain mapping with atomic column resolution, and a quantitative procedure to extract atomic column compositional information from Z-contrast high-resolution images are presented. It also reviews the structural, compositional, and strain results obtained by conventional and advanced transmission electron microscopy methods on a number of III-V semiconductor nanostructures and heterostructures.

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Section: Techniquesmentioning

confidence: 99%

High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

Sales

Beltrán

Lozano

et al. 2012

Semiconductor Research

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“…The numerical method named as angular spectrum backward propagation method that we are using for the hologram reconstruction is based on Fourier-transform method, [26][27][28][29] which can be easily performed by computer. Making the discrete digital hologram a fast Fourier transformation,…”

Section: Fundamentals Of Detectionmentioning

confidence: 99%

Quantitative measurement of domain inversion in RuO2:LiNbO3 crystal by digital holographic interferometry

Liu

et al. 2006

Journal of Applied Physics

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We quantitatively study the domain inversion in a RuO 2 : LiNbO 3 crystal wafer by the digital holographic interferometry. The crystal wafer is placed into one arm of a Mach-Zehnder-type interferometer to record a series of holograms. Making use of the angular spectrum backward propagation algorithm, we reconstruct the optical wave field in the crystal plane. The extracted phase difference from the reconstructed optical wave field is a well linear function of the applied external voltage. We deduce that the linear electro-optic coefficient of the detected RuO 2 : LiNbO 3 crystal sample is 9.1ϫ 10 −12 m / V. An unexpected phase contrast at the antiparallel domain wall is observed and the influence of the applied external voltage on it is studied in detail. Also the built-in internal field is quantitatively measured as 0.72 kV/ mm.

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“…The interferogram analysis technique used in the current work was based on the two-dimensional Fourier-transform method described by Bone et al [10], Bone [11] and Babinsky and Takayama [12].…”

Section: Overview Of Interferogram Analysismentioning

confidence: 99%

Interferometric measurement of density in nonstationary shock wave reflection flow and comparison with CFD

et al. 2005

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Abstract. We present density measurements from the application of interferometry and Fourier transform fringe analysis to the problem of nonstationary shock wave reflection over a semicircular cylinder and compare our experimental measurements to theoretical results from a CFD simulation of the same problem. The experimental results demonstrate our ability to resolve detailed structure in this complex shock wave reflection problem, allowing visualization of multiple shocks in the vicinity of the triple point, plus visualization of the shear layer and an associated vortical structure. Comparison between CFD and experiment show significant discrepancies with experiment producing a double Mach Reflection when CFD predicts a transitional Mach reflection.

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Fringe-pattern analysis using a 2-D Fourier transform

Cited by 307 publications

References 4 publications

High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

Quantitative measurement of domain inversion in RuO2:LiNbO3 crystal by digital holographic interferometry

Interferometric measurement of density in nonstationary shock wave reflection flow and comparison with CFD

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