2020
DOI: 10.1007/s10854-020-03479-4
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Frequency effect on electrical and dielectric characteristics of HfO2-interlayered Si-based Schottky barrier diode

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Cited by 18 publications
(6 citation statements)
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“…At low frequencies in the applied AC signal, the charges trapped at these states can be found in a contribution to the C()0.25emw0.25em and C()0.25emw0.25em of ITO/CP1 and CP2/ITO electrodes 72,73 . Conversely, they cannot follow the change in this signal at high frequencies, and this fact can be related to the decrease in these values with an increase in frequency 74 . Figure 10A,C shows the Nyquist plot of the same data after transforming it to complex capacitance for CP1/ITO and CP2/ITO electrodes at scan rates 5 mV/s.…”
Section: Resultsmentioning
confidence: 99%
“…At low frequencies in the applied AC signal, the charges trapped at these states can be found in a contribution to the C()0.25emw0.25em and C()0.25emw0.25em of ITO/CP1 and CP2/ITO electrodes 72,73 . Conversely, they cannot follow the change in this signal at high frequencies, and this fact can be related to the decrease in these values with an increase in frequency 74 . Figure 10A,C shows the Nyquist plot of the same data after transforming it to complex capacitance for CP1/ITO and CP2/ITO electrodes at scan rates 5 mV/s.…”
Section: Resultsmentioning
confidence: 99%
“…Besides, the decrease of capacitance at around zero-bias is attributed to the electrical activity of interface traps and deep levels due to higher temperatures. In addition, the changes in capacitance towards high forward biases and high temperatures (around 0.4 V) were also attributed to the reconstruction of the traps and the molecular structure of the interface [35][36][37][38][39].…”
Section: Resultsmentioning
confidence: 99%
“…Figure 10 depicts conductance-applied bias (G-V) plots of the Ni/GO-Fe 3 O 4 /n-Si heterostructure as a function of temperature carried out at 500 kHz applied frequency. The conductance measurements are mainly based on the energy loss resulting from R s and from the interface states with variation of AC signal [36,50]. Namely, when the surface Fermi level is varied with an AC signal, then interface state may capture or emit energy.…”
Section: Resultsmentioning
confidence: 99%
“…In this case, the structure of dielectric curves obtained will be similar to the capacity and conductivity curves. Many researchers use these expressions when studying dielectric spectroscopy [46][47][48][49].…”
Section: Resultsmentioning
confidence: 99%