Field Cooling Induced Changes in the Antiferromagnetic Structure of NiO Films

Zhu, Wenzhong; Sève, L.; Sears, R.; Sinković, B.; Parkin, S. S. P.

doi:10.1103/physrevlett.86.5389

Cited by 99 publications

(76 citation statements)

References 23 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This furnishes an interpretation of the macroscopic behavior of the ferromagnetic layer in terms of the thermally driven evolution of the magnetic state of the antiferromagnet layer. experimentally [1][2][3][4][5][6]. The effect of AFM spins on the EB is difficult to clarify due to the zero net magnetization in the AFM layer [7][8][9][10].…”

mentioning

confidence: 99%

Hysteretic Behavior of Angular Dependence of Exchange Bias inFeNi/FeMnBilayers

et al. 2007

View full text Add to dashboard Cite

For FeNi/FeMn bilayers, the angular dependence of exchange bias shows hysteresis between clockwise and counterclockwise rotations, as a new signature. The hysteresis decreases for thick antiferromagnet layers. Calculations have clearly shown that the orientation of antiferromagnet spins also exhibits hysteresis between clockwise and counterclockwise rotations. This furnishes an interpretation of the macroscopic behavior of the ferromagnetic layer in terms of the thermally driven evolution of the magnetic state of the antiferromagnet layer. 28 degrees for t AFM =10 nm. As shown in Fig. 1(a), H E has almost the same angular dependence for CW and CCW rotations, which will be analyzed below.As discussed below, the results in Fig. 1 are caused by the hysteresis of ADEB. In order to verify this, firstly another CW rotation was measured directly after one cycling of CW and CCW rotations. It is found that the ADEB for the second CW rotation is almost the same as that of the first. Secondly, ∆φ H is shown to be independent of the increment of φ H between neighboring hysteresis loops. Finally, the ADEB of CW and CCW rotations was measured within different φ H regimes. As shown in Fig. 2(a), the angular dependence of m y−AVE is reversible for CW and CCW rotations for small φ H ranges. However, it is irreversible for larger φ H regimes, as shown in Fig. 2(b). Unambiguously, the hysteretic behavior of the ADEB is demonstrated. The hysteresis of the ADEB can be explained qualitatively. Consider a hysteresis loop for the FM layer, i.e.,Calculations show that the average orien- The discrepancy of H E hysteresis between measured ( Fig. 1(a)) and calculated ( Fig. 4(a)) results can be explained as

show abstract

mentioning

confidence: 99%

Hysteretic Behavior of Angular Dependence of Exchange Bias inFeNi/FeMnBilayers

et al. 2007

View full text Add to dashboard Cite

show abstract

“…Many experimental and theoretical studies have shown that the existence of domains in the AF layer is necessary for the appearance of exchange bias in FM/AF bilayers. [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17] Theoretical models have suggested both parallel and perpendicular domain walls. Mauri et al 3 suggested that a domain wall forms in the AF layer parallel to the interface while the magnetization of the FM layer rotates.…”

mentioning

confidence: 99%

Variation of domain formation in a 15 nm NiFe layer exchange coupled with NiO layers of different thicknesses

Liu¹,

Adenwalla²

2003

Applied Physics Letters

View full text Add to dashboard Cite

The correlation between ferromagnetic domain formation and exchange bias in a series of NiFe/NiO samples with varying NiO thicknesses has been investigated using the magneto-optic Kerr effect and magnetic force microscopy. Below a critical thickness (15 nm) of NiO, the exchange bias HE is zero and ripple domains exist in the NiFe layer. Above this critical thickness, cross-tie type domain walls appear concurrently with the appearance of exchange bias. Both the number of cross-tie domain walls and the exchange bias increase with an increase in NiO thickness, reaching a maximum at 35 nm NiO, after which both show a gradual decrease. This variation of domain wall formation in the NiFe layer with the NiO thickness possibly reflects the variation of the domain structure in the NiO layer through interfacial exchange coupling.

show abstract

“…A net AF moment at the interface is necessary for the appearance of both the in-plane and out-of-plane exchange-coupling field. 3,22,23 Field cooling in the presence of a FM layer has been shown to alter the populations of the equivalent AF domains in the NiO layer. 22 Fields parallel to the surface will increase the population of domains with the easy axis parallel to the interface, while an out-of-plane applied field will increase the population of domains with the easy axis perpendicular to the interface.…”

Section: Resultsmentioning

confidence: 99%

“…3,22,23 Field cooling in the presence of a FM layer has been shown to alter the populations of the equivalent AF domains in the NiO layer. 22 Fields parallel to the surface will increase the population of domains with the easy axis parallel to the interface, while an out-of-plane applied field will increase the population of domains with the easy axis perpendicular to the interface. In our as-deposited sample, the field is provided by the FM Ni layer and is directed out-of-plane, leading to a larger population of out-of-plane domains.…”

Section: Resultsmentioning

confidence: 99%

Out-of-plane exchange coupling between epitaxial Ni (50 Å) and NiO (600 Å) bilayers

Liu

Adenwalla

2003

Journal of Applied Physics

View full text Add to dashboard Cite

We have investigated the exchange coupling between an epitaxial Ni ͑50 Å͒ film with an out-of-plane magnetic easy axis and a NiO ͑600 Å͒ film by polar magneto-optic Kerr-effect measurements. The temperature dependences of exchange field H E for both as-deposited and field-cooled states exhibit the same blocking temperature T B ϳ130°C. The exchange field H E for the field-cooled state is lower than that for the as-deposited state. The hard-axis in-plane loop shows a much smaller value of H E . No coercivity enhancement is observed. The data are suggestive of linear coupling across the ferromagnet/antiferromagnet interface.

show abstract

Field Cooling Induced Changes in the Antiferromagnetic Structure of NiO Films

Cited by 99 publications

References 23 publications

Hysteretic Behavior of Angular Dependence of Exchange Bias inFeNi/FeMnBilayers

Hysteretic Behavior of Angular Dependence of Exchange Bias inFeNi/FeMnBilayers

Variation of domain formation in a 15 nm NiFe layer exchange coupled with NiO layers of different thicknesses

Out-of-plane exchange coupling between epitaxial Ni (50 Å) and NiO (600 Å) bilayers

Contact Info

Product

Resources

About