Fiber-top atomic force microscope

Iannuzzi, Davide; Deladi, S.; Berenschot, J.W.; Man, S. de; Heeck, K.; Elwenspoek, Michael Curt

doi:10.1063/1.2358710

Cited by 38 publications

(46 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…From the signal of the readout system, it is thus possible to remotely sense mechanical displacements of the ferrule-top device. 9,10,12,13 It is to note that the fabrication procedure presented here is slightly different with respect to that described in Refs. 12 and 13.…”

Section: Ferrule-top Probe: Fabrication and Readoutmentioning

confidence: 97%

“…In 2006, our group has proposed a new generation of miniaturized devices that may solve this issue: the fiber-top cantilever. 9,10 In a fiber-top probe, the cantilever is carved at the center of the cleaved end of an optical fiber. Light coupled from the opposite side of the fiber can then be used to detect the deflection of the cantilever.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Ferrule-top atomic force microscope

Chavan

Gruca²,

Man³

et al. 2010

Review of Scientific Instruments

Self Cite

View full text Add to dashboard Cite

Compensator design for improved counterbalancing in high speed atomic force microscopy Rev. Sci. Instrum. 82, 113712 (2011) Rotational positioning system adapted to atomic force microscope for measuring anisotropic surface properties Rev. Sci. Instrum. 82, 113710 (2011) Note: Curve fit models for atomic force microscopy cantilever calibration in water Rev. Sci. Instrum. 82, 116107 (2011) Electroplated CoPt magnets for actuation of stiff cantilevers Rev. Sci. Instrum. 82, 115002 (2011) Additional information on Rev. Sci. Instrum. Light coupled from the opposite side of the fiber allows detection of cantilever deflections. In this paper, we demonstrate that ferrule-top cantilevers can be used to develop ultra compact AFMs for contact mode imaging in air and in liquids with sensitivity comparable to that of commercial AFMs. The probes do not require any alignment procedure and are easy to handle, favoring applications also outside research laboratories.

show abstract

Section: Ferrule-top Probe: Fabrication and Readoutmentioning

confidence: 97%

Section: Introductionmentioning

confidence: 99%

Ferrule-top atomic force microscope

Chavan

Gruca²,

Man³

et al. 2010

Review of Scientific Instruments

Self Cite

View full text Add to dashboard Cite

show abstract

“…We demonstrated that these devices can be used as optomechanical transducers 1,2-4 , temperature sensors 1 , hydrogen sensors 5 , and atomic force microscopes 6 . For further details, we refer the reader to our original papers.…”

Section: Fiber-top Cantilevers: Sensors On the Tip Of A Fibermentioning

confidence: 99%

Fiber-top micromachined devices

et al. 2008

Self Cite

View full text Add to dashboard Cite

show abstract

“…Fiber-top cantilevers have been proven to provide a new platform for several applications, including gas sensing, 2 refractive index measurements, 3 and atomic force microscopy. 4 Unfortunately, fiber-top cantilevers are currently fabricated by means of a time consuming process that does not adapt well to series production (namely, focused ion beam milling 5 ). This problem was solved at the beginning of 2010 by introducing a larger (but still compact and monolithic) device that retains the advantages of fiber-top technology without the burden of the fabrication costs: the ferrule-top cantilever.…”

Section: A)mentioning

confidence: 99%