2022
DOI: 10.1109/tuffc.2021.3130194
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Ferroelectric Negative-Capacitance-Assisted Phase-Transition Field-Effect Transistor

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Cited by 10 publications
(4 citation statements)
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“…It has been established that the electrical characteristics of a device produced in this way are poor [31]. To counteract this effect, the buffer layer is placed midway between the ferroelectric layer and the silicon substrate [32][33][34][35]. Negative capacitance is a property of ferroelectric materials such as Si-doped HfO 2 that acts like a stepup transformer and increases the device's driving current and SS [36].…”
Section: Device Architecture and Simulation Deckmentioning
confidence: 99%
“…It has been established that the electrical characteristics of a device produced in this way are poor [31]. To counteract this effect, the buffer layer is placed midway between the ferroelectric layer and the silicon substrate [32][33][34][35]. Negative capacitance is a property of ferroelectric materials such as Si-doped HfO 2 that acts like a stepup transformer and increases the device's driving current and SS [36].…”
Section: Device Architecture and Simulation Deckmentioning
confidence: 99%
“…A recent study has demonstrated the suitability of PTMs in the development of low-power dynamic circuits [5]. Moreover, it has been revealed that combining PTM with the negative capacitance effect improves the sub-threshold slope further and holds great promise for applications in digital devices and memories [6,7].…”
Section: Introductionmentioning
confidence: 99%
“…Ferroelectric materials-based transistors [13]h a v e gotten a lot of interest recently for their ability to provide ultra-low power in memory and steep switching applications due to the negative capacitance property exhibit by ferroelectric materials. These devices have gotten a lot of interest because of their simpler design and CMOS compatibility [14], compared to other state-of-the-art devices such as TFETs [15], HyperFETs [16], and Hybrid FETs [17][18][19]. In addition, the recognition of ferroelectricity in doped hafnium oxides like HZO [20] has rekindled curiosity in NC based FET.…”
Section: Introductionmentioning
confidence: 99%