AbstractData correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed in the previous work. However, the computation of data correlation itself was a computational intensive process and became a bottleneck in the previous work. This paper presents an efficient technique to compute data correlation using Binary Decision Diagrams (BDDs). Once a BDD is built, our algorithms take linear time to comp…
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