Failure Analysis

Bazu, M.; Băjenescu, Titu I.

doi:10.1002/9781119990093

Cited by 34 publications

(2 citation statements)

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“…A number of techniques and methodology have been reported in literature. Table 5 shows the list of destructive and nondestructive testing techniques that are being implemented for MEMS measurements electrically and mechanically [72]. Jeffrey et al [73] reported an online monitoring technique which is based on bias superposition for MEMS integrated sensors.…”

Section: Development Of Different Testing Techniques For Mems Devicesmentioning

confidence: 99%

A Review on Key Issues and Challenges in Devices Level MEMS Testing

et al. 2016

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The present review provides information relevant to issues and challenges in MEMS testing techniques that are implemented to analyze the microelectromechanical systems (MEMS) behavior for specific application and operating conditions. MEMS devices are more complex and extremely diverse due to the immersion of multidomains. Their failure modes are distinctive under different circumstances. Therefore, testing of these systems at device level as well as at mass production level, that is, parallel testing, is becoming very challenging as compared to the IC test, because MEMS respond to electrical, physical, chemical, and optical stimuli. Currently, test systems developed for MEMS devices have to be customized due to their nondeterministic behavior and complexity. The accurate measurement of test systems for MEMS is difficult to quantify in the production phase. The complexity of the device to be tested required maturity in the test technique which increases the cost of test development; this practice is directly imposed on the device cost. This factor causes a delay in time-to-market.

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Section: Development Of Different Testing Techniques For Mems Devicesmentioning

confidence: 99%

A Review on Key Issues and Challenges in Devices Level MEMS Testing

et al. 2016

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“…4 Failure mode and effects analysis is another technique that may be used to aid in identifying possible failures, quantifying how frequently they occur, and qualifying the consequences of their impact with the goal to reduce or eliminate failures. 5 Devices with fault-tolerant designs, such as life-supporting or life-sustaining medical devices, have to continue to function in the realization of a failure and continue to deliver the necessary clinical function (or alarm accordingly). Under International Electrotechnical Commission (IEC) standards such as IEC 60601-1, a medical device has to maintain its essential performance, even if there is a single fault condition.…”

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confidence: 99%

Medical Device Recalls for Electronic Components

Block

Mackey

2023

J Clin Eng

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Through the advancement of technology, an ever-increasing number of medical devices contain electronic components and sensors. As a result of these technological advances, smaller devices need more memory, sensors, processing power, and increased energy requirements. Ultimately, the performance of many medical devices is directly dependent on the functionality of these interconnected electronic components. In this article, medical device recalls are examined for malfunctions of electronic systems and components with respect to what system or component specifically did not perform as intended. From this examination, recalls related to electronic medical device systems and components are identified and grouped into common themes. By alerting the Food and Drug Administration to medical device failures, clinical engineering staff can help make manufacturers aware of issues that can be used to make future design changes or mitigations that can ultimately improve the performance and reliability of electronic medical devices.

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EOS Failure Analysis

2013

Electrical Overstress (EOS)

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Failure Analysis

Cited by 34 publications

References 0 publications

A Review on Key Issues and Challenges in Devices Level MEMS Testing

A Review on Key Issues and Challenges in Devices Level MEMS Testing

Medical Device Recalls for Electronic Components

EOS Failure Analysis

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