“…DIA, typically including MS E , all-ion fragmentation (AIF), and MS ALL and SWATH, is able to record the MS 2 information for all of the precursor ions recorded in the full-scan MS 1 spectra, which can offer the steady scan points and enable the precise quantification and good data traceability. , Nevertheless, the MS 2 data acquired by DIA inevitably necessitates deconvolution to achieve the matching between the precursors and the product ions. , Comparatively, DDA has been more frequently used, by which the MS n data acquisition relies on a series of specific criteria, such as the MS intensity ranking (top N), predefined neutral loss, characteristic product ions, and the inclusion or exclusion of predefined ions. − The MS 2 data obtained by DDA are simple to elucidate, but its reproducibility and coverage on the targeted components are comparatively low . Notably, including a precursor ions list (PIL) in DDA is effective to boost the coverage, and multiple approaches have been utilized to generate the PIL involving the desired masses, such as the summary of the available literature, neutral loss filtering, and different mass defect filtering (MDF) algorithms. − Moreover, an increasing trend has merged that develops hybrid scan strategies to integrate DIA and DDA within a single LC/MS run. − …”