2008
DOI: 10.1109/tpel.2008.2004703
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Experimental Verification of Hopf Bifurcation in DC--DC Luo Converter

Abstract: DC-DC converters have been reported as exhibiting a wide range of bifurcations and chaos under certain conditions. This paper analyzes the bifurcations in current-controlled Luo topology operating in continuous conduction mode using continuous-time model. The stability of the system is analyzed by studying the locus of the complex eigenvalues, and the characteristic multipliers locate the onset of Hopf bifurcation. The 1-periodic orbit loses its stability via Hopf bifurcation, and the resulting attractor is a … Show more

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Cited by 47 publications
(35 citation statements)
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“…The dynamics obtained by varying the load and reference voltage, with the remaining parameters constant show a fundamental operation initially and eventually to enter into the chaotic regime through a quasi periodic operation [31].…”
Section: Fig 2 Occurrence Of Hopf Bifurcation Through Torus Breakdomentioning
confidence: 94%
“…The dynamics obtained by varying the load and reference voltage, with the remaining parameters constant show a fundamental operation initially and eventually to enter into the chaotic regime through a quasi periodic operation [31].…”
Section: Fig 2 Occurrence Of Hopf Bifurcation Through Torus Breakdomentioning
confidence: 94%
“…The technique of Hopf bifurcation control has been widely applied to solve physical and engineering problems (including electronic circuits [3][4][5], power systems [6][7], chemical [8], etc.). The control of Hopf bifurcation system has become a prime subject in nonlinear dynamics and has been widely investigated in recent years [9][10][11][12].…”
Section: Introductionmentioning
confidence: 99%
“…With them operating, some irregular phenomena often arise, such as a sudden collapse of the running state, an unknown electromagnetic noise, instability of the running system. These behaviors greatly affect the stability of the system [1][2][3][4]. However, they have been often ignored or treated as a fault by practical circuit designers for a long time.…”
Section: Introductionmentioning
confidence: 99%